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Digital Design and Test Webcast Series
Live and on-demand broadcasts that will teach you new measurement techniques that will help you get your product to market faster

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DesignCon 2017
February 1-2, 2017; Santa Clara Convention Center, CA

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Unlocking Wideband 5G & mmWave Insights to 110 GHz Webcast
Original broadcast November 2, 2016

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NFC Automated Device Validation using an Oscilloscope Webcast
Original broadcast October 18, 2016

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Supporting PAM-4 Optical Link Development Webcast
Original broadcast December 10, 2015

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Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

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International Microwave Symposium (IMS) 2016
May 22-27, 2016; San Francisco, CA

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Troubleshooting Coherent Optical Communication Systems Webcast
Original broadcast April 22, 2015

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MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow
Original broadcast October 21, 2014

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Best Practices to Optimize Power Meter Sensor Measurements Webcast
Original broadcast October 21, 2015

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Achieving Fast, Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range Webcast
Original broadcast September 9, 2015

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Seven Best Practices to Avoid Damaging Power Meters and Sensors Webcast
Original broadcast July 30, 2015

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RF/uW Switching Solutions Webcast
Original broadcast July 8, 2015

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Addressing Multi-Channel Synchronization for MIMO and Beamforming Test Webcast
Original broadcast April 28, 2015

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Bridging the Gap from Benchtop to PXI: A Common Software Strategy Webcast
Original broadcast March 26, 2015

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One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast
Original broadcast March 11, 2015

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PCI Express 3.0 Compliance - Successfully Navigating the Standard Webcast
Original broadcast May 7, 2013

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Boundary Scan Webcast Series
Live and on-demand webcasts

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Best practices in implementing boundary scan on limited access boards
Original broadcast December 18, 2014

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Testing limited access SSD boards with boundary scan and external instruments webcast
Original broadcast December 4, 2014

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Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast
Original broadcast November 13, 2014

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Testing DDR on limited access boards using boundary scan silicon nails
Original broadcast October 30, 2014

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Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains
Original broadcast October 9, 2014

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Extending boundary scan tests to improve test coverage of limited access boards webcast
Original broadcast September 25, 2014

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Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast
Original broadcast August 26, 2014; 9am PT / 12pm ET

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