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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

DesignCon 2015
Download Keysight's papers from Technical Conference; Jan 27-29, 2014; Santa Clara Convention Center

Tradeshow

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Electronic Measurement Events in Europe, Middle East & Africa
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

Webcast - recorded

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

Webcast - recorded

International Microwave Symposium (IMS) 2015
May 17-22, 2015; Phoenix, AZ

Tradeshow

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

Keysight's Events for United Kingdom and Ireland
Welcome to Keysight's Upcoming Events Page for United Kingdom and Ireland

Seminar

Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

Webcast - recorded

New Techniques and Methods to Evaluate Power Device Switching Loss Webcast
Original broadcast Ocotber 14, 2014

Webcast - recorded

Quickly Identify and Characterize Temperature Measurement Points Webcast
Original broadcast February 3, 2015

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

Webcast - recorded