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IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

Application Note 2015-11-06

Impedance Measurement Handbook - 5th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2015-10-07

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

Programming with the N937xA PXIe Vector Network Analyzers - Application Note
This application note discusses the process of developing a C# application using an IVI driver as the programming remote driver for the M937xA PXIe vector network analyzer.

Application Note 2015-07-07

PDF PDF 4.75 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

Application Note 2014-12-05

PDF PDF 607 KB
Radar Measurements - Application Note
This application note focuses on the fundamentals of measuring basic pulsed radars and measurements for more complex or modulated pulsed radar systems.

Application Note 2014-08-22

PDF PDF 6.84 MB
Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

Application Note 2014-08-04

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Evaluating Oscilloscopes for Low-Power Measurements - Application Note
The Infiniium 9000 Series oscilloscope is three instruments in one: scope, logic analyzer, and protocol analyzer, and it offers the widest range of debug and compliance application software.

Application Note 2014-04-16

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Tips for Making Low Current Measurements with an Oscilloscope and Current Probe
An oscilloscope and a clamp-on current probe provide an easy way to make current measurements without necessarily breaking the circuit.

Application Note 2012-12-10

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Application Note 2012-10-30

Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

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