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Parametric Test Systems

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The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2014-01-22

Are You Ready to Migrate to the Platform that Solves Your Toughest Test Challenges?
The 4080 overcomes advanced measurement challenges with faster system architecture, synchronous and asynchronous parallel test capabilities, high-voltage semiconductor pulse generator units, automated RF calibration, and an optional 20 GHz RF matrix.

Brochure 2008-08-27