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Electronic Measurement

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Agilent to Acquire Centellax’s Test and Measurement Business
Agilent Technologies Inc. (NYSE: A) and Centellax today announced they have signed a definitive agreement for Agilent to acquire the assets of Centellax's test and measurement business.

Press Materials 2012-04-27

N4880A Reference Clock Multiplier Data Sheet
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

PDF PDF 3.31 MB
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators - Data Sheet
81133A and 81134A, 3,35 GHz Pulse-/Pattern Generators Data Sheet

Data Sheet 2012-03-14

PDF PDF 595 KB
81133A and 81134A, 3.35 GHz Pulse Pattern Generators - Data Sheet
81133A and 81134A 3.35 GHz Pulse Pattern Generators. The need for pulse and pattern generation is fundamental to any device characterization task.The ability to emulate the pulse and pattern conditions to which the device will be subjected is essential.This emulation should include both typical and worst case conditions.Such accurate emulation requires superlative signal integrity and timing performance along with full control over parameters that allow specific worst case testing.

Data Sheet 2012-03-14

I2C and SPI Protocol Triggering and Decode for Infiniium 8000 and 90000 Series Oscilloscopes
Extend your scope capability with I2C and SPI Triggering and Decode application. This application makes it easy to debug and test designs that include I2C or SPI protocols using your Infiniium 90000 or 8000 Series scope.

Data Sheet 2012-03-11

S-parameter Series: Using the Time-Domain Reflectometer Application Note
Time Domain Reflectometers provide digital designers with powerful tools that display traditional impedance measurements and solutions that generate accurate S-parameter measurements -for de-embedding

Application Note 2012-03-01

N4906B Serial BERT Getting Started Guide
A guide to get started with the N4906B Serial BERT

Quick Start Guide 2012-03-01

PDF PDF 1.81 MB
N4916B De-Emphasis Signal Converter User's Guide
Revision 3 (Released with N4916B Software 1.1.13.0).

User Manual 2012-02-01

PDF PDF 921 KB
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J (PN 86100-8)
Due to the inherent limitations of parallel technology, SATA is expected to replace parallel ATA everywhere, and expand the use of ATA-based technology in the entry server and network storage market segments.

Application Note 2012-01-31

PDF PDF 2.73 MB
Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Application Note 2012-01-27

N2101B 10.3125 Gb/s Bit Error Ratio Tester - Data Sheet
The N2101B PXIT 10.7 Gb/s Bit Error Ratio Tester consists of a high accuracy clock source, data pattern generator, and error detector. It will automatically perform bit error ratio analysis to characterize the quality of devices at 10 standard internal rates from 155 Mb/s to 8.5 Gb/s.

Data Sheet 2012-01-27

86108B Precision Waveform Analyzer
As high-speed electrical communication systems and components increase in data rates to 25 Gb/s and beyond, design and validation engineers are faced with the difficult task of accurately

Data Sheet 2012-01-27

Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generator - Brochure
This Keysight family of pulse/pattern generators can help you verify and characterize digital or analog systems, products, and components.

Brochure 2012-01-27

PDF PDF 1.48 MB
PCI Express Design and Test From Electrical to Protocol - Brochure
Keysight's PCI EXPRESS® brochure will explain basic differences between Gen1, Gen2, and Gen3 as well as the full breadth of Keysight's PCIe solutions.

Brochure 2012-01-17

PDF PDF 1.26 MB
Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters, Flex DCA Interface
Keysight continues innovating test methodologies to assist manufacturing engineers in meeting or beating cost-of-test reduction goals.

Application Note 2011-12-22

Techniques to Reduce Manufacturing Cost-of-Test of Optical Transmitters
Pressures to reduce costs as data rates rise means manufacturing engineering managers and their engineers must be more creative in how to reduce costs before their competitors do.

Application Note 2011-12-22

PXIT N2100B DCA Video
New PXIT N2100B DCA Demonstration Video Here you can see the recently launched 10.3125 Gb/s DCA of the PXIT Product Family. The Video goes over the key benefits and demonstrates its new features.

Demo 2011-12-07

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

N2101B 10.3125 Gb/s Bit Error Ratio Tester
This flyer provides a brief description of the features and benefits the N2101B Gb/s Bit Error Ratio Tester provides.

Brochure 2011-11-27

PDF PDF 243 KB
N2102B Pattern Generator
This flyer provides a brief description of the features and benefits of the N2102B Pattern Generator

Brochure 2011-11-27

PDF PDF 310 KB
N2099A Synthesizer
This flyer provides a brief description of the N2099A synthesizer and it's main features and benefits.

Brochure 2011-11-27

PDF PDF 209 KB
Installation Instructions for the N1010A FlexDCA scope application
This 5-minute video provides an overview of how to download and install the N1010A FlexDCA scope application. It also describes how to obtain a 30-day trial license should you want to try any of the advanced features.

How-To Video 2011-11-01

Lowest Cost of Optical Transceiver Test
Explore major cost of test reduction ideas using the Eye Mask Hit Ratio Technique and the Auto Mask Margin function. Achieve dramatic efficiency improvement in optical transmitter eye-mask testing.

Product Tour 2011-11-01

N1010A FlexDCA Virtual Device Demonstration
N1010A FlexDCA Virtual Device Demonstration Video This 3 minute video shows how to help sell high-speed semiconductors using the N1010A FlexDCA.

Product Tour 2011-11-01

De-embedding demo using InfiniiSim-DCA
This 7 minute video documents a de-embedding measurement using InfiniiSim-DCA for the 86100C DCA-J

How-To Video 2011-11-01

WMF WMF 38.44 MB

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