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V9071B and Y9071B GSM/EDGE Online Documentation for E6640A (.chm file)
Downloadable help file for the GSM/EDGE mode of the Keysight E6640A EXM Wireless Test Set. Includes information about the test set, menus, programming commands, system functions, and measurement functions.

Help File 2015-02-01

U2781A Quick Start Guide
Quick Start Guide for the U2781A USB Modular Instrument Chassis.

Quick Start Guide 2015-02-01

V9064B VXA Online Documentation for E6640A (.chm file)
Downloadable help file for the Vector Signal Analyzer mode of the Keysight E6640A EXM Wireless Test Set. Includes information about the test set, menus, programming commands, system functions, and measurement functions.

Help File 2015-02-01

V9072B and Y9072B cdma2000 Online Documentation for E6640A (.chm file)
Downloadable help file for the 1xEV-DO mode of the Keysight E6640A EXM Wireless Test Set. Includes information about the test set, menus, programming commands, system functions, and measurement functions.

Help File 2015-02-01

85050D 7mm Economy Calibration Kit User's and Service Manual
Provides user and service information for the 85050D calibration kit such as specifications; use, care, and maintenance of the device; performance verification; troubleshooting; replaceable part; and standard definitions.

User Manual 2015-02-01

PDF PDF 798 KB
N4960A Serial BERT 17 and 32 Gb/s - Getting Started Guide
The getting started guide helps you identify the contents of the shipping package, perform a quick functional check of the product, and guide you on where to find more information and support for the N4960A.

Quick Start Guide 2015-02-01

85133E/F/H NMD-2.4 mm -f- to 2.4 mm Flexible Test Port Return Cables Operating and Service Manual
Provides information on specifications, use, maintenance, and replaceable parts for the 85133E/F/H NMD-2.4 mm -f- to 2.4 mm flexible test port return Cables.

Operation Manual 2015-02-01

Lightwave Catalog: 2015 Bit Error Ratio and Waveform Analysis Volume 3 - Catalog
Volume III covers “Bit Error Ratio & Waveform Analysis” for data center and cloud environment.

Catalog 2015-01-31

PDF PDF 2.41 MB
Lightwave Catalog: 2015 Optical-Electrical, Signal Generation, Complex Modulation Analysis Volume 2
Volume II covers “Optical –Electrical/Polarization/Complex Modulation Analysis“ for the transmission networks.

Catalog 2015-01-31

PDF PDF 3.69 MB
Lightwave Catalog: 2015 Optical Component Test Volume 1 - Catalog
Volume I covers “General Photonic Instruments” to characterize single-mode and multimode fiber-optic components, especially at the physical layer.

Catalog 2015-01-31

PDF PDF 1.88 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

LTE RF Conformance and DV Test System - Technical Overview
The T4010S LTE RF test systems are automated solutions for conformance test and design verification of LTE UE. This document covers key benefits, features, technical specifications and ordering info.

Technical Overview 2015-01-29

Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-28

PDF PDF 778 KB
E5080A ENA Series Network Analyzer - Data Sheet
This literature describes the technical specifications for E5080A and E5092A.

Data Sheet 2015-01-28

PDF PDF 2.90 MB
U1881A and U1882A Measurement Application for InfiniiVision and Infiniium Oscilloscopes - Data Sheet
The U1881A and U1882A power measurement applications for Keysight oscilloscopes provide a full suite of power measurements.

Data Sheet 2015-01-28

8157xA Optical Attenuators - Data Sheet
Keysight 8157xA Variable Optical Attenuators are instruments that attenuate and control the optical power level of light in single mode optical fibers. As plug-in modules for Agilent's Lightwave Solution platform (8163A/B, 8164A/B, 8166A/B) they allow you to set the attenuation factor and/or power level manually, or remotely via a common computer interface. Their high accuracy combined with their flexibility make them ideal as test and measurement equipment for the modern telecommunication industry.

Technical Overview 2015-01-26

Instructions for Using the Electronic Calibration (ECal) Kit Storage Box
Provides instructions for determining which of the foam inserts inside the storage box are removed to hold the ECal module and accessories.

User Manual 2015-01-23

PDF PDF 137 KB
86100D-9FP PAM-N Analysis Software for 86100D DCA-X Oscilloscopes - Data Sheet
The 86100D-9FP PAM-N analysis software for 86100D DCA-X Series oscilloscopes helps you quickly and accurately analyze electrical and optical Pulse Amplitude Modulated (PAM) signals.

Data Sheet 2015-01-23

PDF PDF 3.16 MB
HDMI and DisplayPort Design and Test – A Better Way - Brochure
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
J-BERT offers adjustable and integrated inter-symbol interference
J-BERT offers adjustable and integrated inter-symbol interference

Press Materials 2015-01-22

Keysight Extends UXM Wireless Test Set LTE-A Carrier Aggregation Support with 3CC, TDD, Uplink
The E7515A UXM wireless test set adds features to address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements.

Press Materials 2015-01-21

Digital BGA Interposer Catalog
To complement Keysight's high-speed digital instruments and software, we offer a probing solutions with a comprehensive Ball Grid Array (BGA) interposers that allow signal quality or protocol measurements with minimal effect on the system-under-effect.

Catalog 2015-01-20

PDF PDF 4.81 MB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB

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