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System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters (AN 1389-1)
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors and more.

Application Note 2017-03-14

Fundamentals of PXI Integration - Application Note
Easily integrate PXI instruments into your test system

Application Note 2017-03-13

Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Resistance; DC Current; AC Current; and Frequency and Period Measurement Errors in DMMs
This application note is the second in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers resistance, dc current, ac current, and frequency and period measurement errors. . For an overview of system cabling errors and dc voltage measurement errors, see Application Note 1389-1. For a discussion of ac voltage measurement errors, see Application Note 1389-3.

Application Note 2017-03-09

Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Photodiode Test Using the Keysight B2980A Series - Application Note
This application note explains how easy and accurately it is to make a photodiode test using the B2980A Series.

Application Note 2017-03-09

Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2017-03-07

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Application Note 2017-03-06

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

The CX3300 Unveils Current Waveform Never Seen by Conventional Current Probes - Application Brief
This application describes that the CX3300A can more clearly and precisely visualize current waveform measurements in comparison with a current probe.

Application Note 2017-03-03

x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

PDF PDF 6.17 MB
IoT – With Great Power Comes Great Challenges - Application Note
This app note addresses the rising challenges for IoT device designers and developers at component, circuit and system levels. What are the tools and solutions available, and test considerations.

Application Note 2017-03-01

Eye on 802.11ax:What It Is and How to Overcome the Design & Test Challenges It Creates - White Paper
This white paper introduces key technologies of 802.11ax and presents some unique challenges for the engineers designing and testing 802.11ax devices.

Application Note 2017-02-28

PDF PDF 2.52 MB
Assessing and Improving Radar System Performance - Application Note
This application note provides insights into assessing and improving radar system performance, and is part 7 in a series of radar application notes.

Application Note 2017-02-27

PDF PDF 2.64 MB
Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2017-02-27

Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 2.91 MB
Evolution to 5G Massive MIMO: Beamforming Simulation and Measurement - Application Brief
Overview of new requirements for the development and implementation of massive MIMO technology within the 5G ecosystem, including tools required to simulate, design and test highly complex systems.

Application Note 2017-02-23

PDF PDF 1.06 MB
Evolution of the Radio Access Network: Fronthaul Test and Monitoring - Application Brief
Overview of fronthaul test and monitoring solutions from Keysight Technologies for Radio Access Networks (RAN).

Application Note 2017-02-23

PDF PDF 386 KB
N437x Lightwave Component Analyzer Automation – Getting Started with SCPI - Application Note
The Keysight N437x Series Lightwave Component Analyzer (LCA) measures the transfer function of electrical to electrical, electrical to optical, optical to electrical, and optical to optical components

Application Note 2017-02-23

PDF PDF 1.81 MB
The Real “Total Cost of Ownership” of Your Test Equipment
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.

Application Note 2017-02-22

KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB

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