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Overcome LTE-A UE Design Test Challenges with Agilent’s New UXM Webcast Slides
Slides from the February 13, 2014 webcast

Seminar Materials 2014-02-13

PDF PDF 3.80 MB
Analyze, Validate and Debug High Speed Memory
This Webcast will demonstrate techniques and solutions for performing turn-on, interoperability, validation and compliance testing of high data rate DDR3 memory based products.

Webcast - recorded

MQA: The Golden Standard for Device Model Validation
MQA comprehensively and effectively analyses, compares and documents device models.

Webcast - recorded

Introduction to 802.11ac WLAN Technology and Testing
This web seminar provides an introduction to the new IEEE 802.11ac standard that is under development to address the need for “very high throughput.”

Webcast - recorded

Making Your Most Accurate DDR4 Compliance Measurements
Making Your Most Accurate DDR4 Compliance Measurements

Webcast - recorded

Debug Digital Designs Faster with Advanced Parametric Triggering
Advanced parametric triggering can help synchronize oscilloscope acquisitions and display complex signal activity. Find signal parametric violation conditions such as setup & hold, edge speed, pulse amplitude (runts), pulse width violations, etc.

Webcast - recorded

Think Outside the Box: PC-based Oscilloscope Analysis Software
Ever wish you could do additional signal viewing, analysis and documentation tasks away from your scope and target system? With Keysight’s InfiniiView oscilloscope analysis software, now you can.

Webcast - recorded

DC Power supply fundamentals to get the most out of your applications
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

Increase spectral efficiency in coherent optical communication
With Social Networks and Visual Online Contents the data trafic is forecasted to reach 6.3 Exabytes per month by 2015. To handle this, Provider need to adapt their networks. The upcoming webinar proposes how to face this challenge.

Webcast - recorded

Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

New High Speed DDR Probing and Analysis Tool
EMEA session - New High Speed DDR Probing and Analysis Tool

Webcast - recorded

Waveform Ghost Busters; Capturing and Analysing Random and Infrequent Signal Anomalies
This webcast will discuss the various characteristics of oscilloscopes that should be considered to debug designs including: bandwidth, sample rate, memory depth, waveform update rate, and triggering (including the New InfiniiScan Zone Trigger).

Webcast - recorded

Nonlinear characterisation and modeling through pulsed IV/S-parameters
This web seminar will put examples and discuss the design flow from Pulsed IV and Pulsed S-Parameters to Compact Transistor Models.

Webcast - recorded

Accelerating USB 3.0 Product Development
Super speed USB presents new challenges for designers and developers. Whether you are designing host, hub or device, Electrical or protocol, Agilent offers a complete solution for debug and validate your design.

Webcast - recorded

Characterizing MIL-STD 1553 and ARINC 429 Serial Bus Networks
This webinar will discuss how modern Oscilloscopes are able to trigger and automatically decode MIL-STD 1553 and ARINC429 serial buses. In addition we will analyse physical layer characteristics and perform a pass/fail test using an eye-diagram.

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope
This webinar will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

What’s happening with IEEE std. 1149.1 Boundary Scan?
The IEEE is revamping it, in a big way. What does that mean to test engineers?

Webcast - recorded

IEEE 802.11ad PHY Layer Testing
This web seminar will start with a brief tutorial introduction to the IEEE 802.11ad PHY layer. We will then review a variety of modulation analysis measurements and consider what can each of them tell us about the device under test.

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Physical Layer design challenges for PCI Express® 3.0 and 2.0 designs
You will learn advanced techniques for PCI Express phy-layer validation covering the latest PCIe 3.0 specification requirements as well as practical extensions to PCIe 2.0 and 1.1 designs. This seminar analyzes transmitter and receiver performance.

Webcast - recorded

Debugging automotive serial buses using an Agilent InfiniiVision Series oscilloscope (Italiano)
We will give an overview of the timing and protocol structure of the LIN, CAN and FlexRay buses. We will show Keysight’s Hardware based decoding to capture random errors and time-correlate data transfer information with the physical layer.

Webcast - recorded

Debugging Serial Buses using an InfiniiVision Series Oscilloscope
EMEA Web seminar - Debugging Serial Buses using an InfiniiVision Series Oscilloscope

Webcast - recorded

Radar Pulse Measurements using NEW Peak Power Analyzer
The new 8990A has higher performance coupled with more features offering better value. Seminar will highlight some key features and illustrate how the new peak power analyzer is used to perform efficient pulse characterization in various applications

Webcast - recorded

Digitizer fundamentals: Design considerations to achieve superior measurements
More than just understanding banner specs such as bandwidth and sampling rate, this webinar will arm you with knowledge of digitizer technology and underlying specifications to ensure you make accurate measurements that meet your application needs.

Webcast - recorded

Eliminate the need for cumbersome multi-instruments setups for stress testing devices
EMEA web seminar - Eliminate the need for cumbersome multi-instruments setups for stress testing devices

Webcast - recorded

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