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Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

Webcast

mmWave 5G Phased Array and Beamforming System Design Webcast
Original broadcast September 28, 2017

Webcast - recorded

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2017-08-08

Fundamentals of IV Measurements Webcast
Original broadcast February 8, 2017

Webcast - recorded

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
WaferPro Express 2016.04 Key Features and What's New
Overview of what's new in WaferPro Express 2016.04.

Training Materials 2016-07-12

PDF PDF 1.79 MB
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

MQA: The Golden Standard for Device Model Validation
MQA comprehensively and effectively analyses, compares and documents device models.

Webcast - recorded

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

PDF PDF 1.48 MB
Wireless Symposium
learn more about the latest test tips, tools, techniques, and solutions for getting your products to market

Seminar

Keysight MQA And MBP Tools For Effective Device Modeling And Verification
This Webcast introduces two software packages which help to obtain the most reliable modeling results for electronic devices (e.g. MOS transistors): fitting measurement data and also verifying the robustness of the obtained model.

Webcast

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
Automating On-Wafer Measurements with the New Agilent IC-CAP WaferPro
Webcast slides describing on-wafer semiconductor device measurement challenges and WaferPro

Seminar Materials 2011-01-27

PDF PDF 1.05 MB
IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training

What's new in IC-CAP 2010.08?
Overview of the new features included in the IC-CAP 2010.08 release.

Training Materials 2010-08-13

PDF PDF 793 KB
Agilent Wireless Test & Design World 2009 in Seoul, Korea
Agilent EEsof EDA related materials presented at the Agilent Wireless Test & Design World 2009

Seminar Materials 2009-07-01