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Electronic Measurement

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Speed Time to Market with Consistent Measurements from R&D Through Manufacturing - Application Note
This white paper describes the benefits of having a choice of bench top or modular instruments that are supported by common software applications.

Application Note 2014-11-17

TS-8989 PXI Functional Test System - System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2014-11-06

PDF PDF 611 KB
PXI Interoperability-How to Achieve Multi-Vendor Interoperability in PXI Systems - Application Note
The purpose of this application note is to impart confidence through knowledge, discussions,and demonstrations of smooth implementations amd coexistence of PXI HW, SW and related tools

Application Note 2014-08-03

PDF PDF 6.63 MB
Accelerate Program Development using Command Expert with Keysight VEE Pro - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with VEE Pro.

Application Note 2014-08-02

PDF PDF 1.53 MB
Accelerate Program Development with Command Expert with Microsoft(R) Visual Studio(R)
This application note describes how Command Expert with Microsoft Visual Studio can accelerate program development

Application Note 2014-08-02

PDF PDF 1.88 MB
Accelerate Program Development using Command Expert with MATLAB - Application Note
Command Expert is a free software tool that enables fast and easy instrument control from PC applications. This application note focuses on the integration with MATLAB.

Application Note 2014-08-02

PDF PDF 5.98 MB
Find the right switching solutions for your test and measurement needs
This application note will provide an overview of the types of microwave switches available and their performance capabilities to assist you in selecting the most appropriate switch.

Application Note 2014-08-01

PDF PDF 356 KB
Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Application Note 2014-08-01

Choosing the Test System Software Architecture - Application Note
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

M9018A PXIe Chassis Power Calculator
Allows you to enter ambient air temperature, AC supply voltage, etc. and calculates the total power available to the chassis modules.

Analysis Tool 2014-07-01

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application note overview provides an overview of the challenges and recommended solutions to increase the speed of power amplifier test.

Application Note 2014-04-30

Signal generation enables cost-effective testing

Application Note 2014-04-07

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Application Note 2014-03-25

PDF PDF 5.09 MB
Cost Effective Design Verification Test of 802.11ac Wireless Transmitters and Receivers - App Note
This application brief highlights ways to use the M9391A PXIe VSA and 89600 VSA software with the M9381A PXIe VSG to address wide bandwidth, multi-channel testing needs for WLAN 802.11ac.

Application Note 2013-11-20

Increase Power Amplifier Test Throughput with the Keysight M9381A PXIe Vector Signal Generator
An application note with programming instructions on how to accelerate power amplifier test throughput with the fast Keysight M9381A PXIe Vector Signal Generator and achieve cost reductions in test while maintaining high test quality.

Application Note 2013-11-19

What is the difference between an equivalent time and a real-time oscilloscope? - Application Note
This document will discuss how each type of oscilloscope samples the incoming waveform and explain the trigger requirements.

Application Note 2013-11-18

Accelerate Development of Next Generation 802.11ac Wireless LAN Transmitters-Overview – App Brief
This application note overview describes how to accelerate the development of next generation 802.11ac wireless LAN transmitters.

Application Note 2013-10-29

Easily Create Custom Waveforms with Waveform Creator - Application Note
This application note provides instructions for how to create custom waveform plug-ins using the M9099 Waveform Creator application software

Application Note 2013-10-01

PDF PDF 593 KB
Optimize Transceiver Test Throughput with the Keysight PXIe Vector Signal Analyzer and Generator
This application brief provides key issues and recommended solutions for increasing the speed of transceiver test.

Application Note 2013-08-27

PDF PDF 1.10 MB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Wideband MIMO PXI Vector Signal Analyzer Multichannel Wideband Configuration White Paper
This white paper describes a wideband MIMO configuration of the Keysight PXI VSA with up to 8 synchronized channels of wideband capability at much higher speeds than oscilloscope based solutions.

Application Note 2013-07-10

PDF PDF 11.24 MB
High-speed ADC chipsets benefit from optimized components

Application Note 2013-05-07

Using high-speed digitizers for Test and Measurement applications

Application Note 2013-05-07

FPGA-based averaging can improve measurement results

Application Note 2013-05-07

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