Discuter avec un expert

Support technique

Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

1-21 sur 21

Tri:
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

Notes d’application 2015-04-10

PDF PDF 2.90 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

Notes d’application 2015-04-10

PDF PDF 2.99 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

Notes d’application 2015-04-08

PDF PDF 6.94 MB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Notes d’application 2015-03-11

PDF PDF 5.66 MB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Notes d’application 2015-03-11

PDF PDF 5.74 MB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Notes d’application 2015-02-24

PDF PDF 4.76 MB
Different Contrast Mechanisms in SEM Imaging of Graphene - Application Note

Notes d’application 2015-02-24

PDF PDF 1.75 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note

Notes d’application 2015-02-20

PDF PDF 3.66 MB
8500B Field-Emission Scanning Electron Microscope - Data Sheet
Features, benefits and specifications for the 8500B FE-SEM

Fiche signalétique 2015-01-22

PDF PDF 265 KB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Notes d’application 2015-01-17

PDF PDF 1.92 MB
8500 FE-SEM System - Brochure

Brochure 2014-12-03

PDF PDF 1.29 MB
Low Voltage Scanning Electron Microscopy: Promises and Challenges - Application Note

Notes d’application 2012-06-13

PDF PDF 302 KB
FE-SEM Image Library

Démonstration de base 2012-01-11

The Role of Compact Low Voltage FE-SEM in the Analysis of AFM Cantilevers - Application Note
Application Note on the study of AFM cantilivers using the 8500B FE-SEM

Notes d’application 2011-11-02

PDF PDF 2.50 MB
The Role of a Compact Low Voltage FE-SEM in Semiconductor Failure Analysis

Notes d’application 2011-10-04

PDF PDF 415 KB
Stereomicroscopy: 3D Imaging and the Third Dimension Measurement

Notes d’application 2011-09-19

PDF PDF 542 KB
Visualizing Carbon nanotubes with LV FE-SEM

Notes d’application 2011-09-06

PDF PDF 551 KB
Use Low Voltage FE-SEM to Overcome Challenges of Imaging Biological Specimens

Notes d’application 2011-08-31

PDF PDF 843 KB
Low Voltage FE-SEM Examination of Organic Polymers

Notes d’application 2011-08-24

PDF PDF 781 KB
Mechanical Characterization of Grey & Brown Hair

Notes d’application 2011-07-20

PDF PDF 169 KB
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization via Electron Channeling Contrast Imaging

Notes d’application 2010-08-06

PDF PDF 287 KB