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Electronic Measurement

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High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

Technical Overview :Technique for Controlling Keysight External DC Power Supply
Technique for Controlling Keysight External DC Power Supply From SMU to expand SMU output power capability.

Application Note 2006-08-01

PDF PDF 1.01 MB
High Speed L-I-V Test of Laser Diode Using Keysight E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

Evaluation of High Voltage Characteristics of Semiconductor Processes and Devices to 400V AN E5270-3
This application note introduces a technique for expanding the output voltage using the SMU of the Keysight E5270A 8-slot Parametric Measuremnet Mainframe.

Application Note 2003-10-06

PDF PDF 544 KB
Accurate High Power Device Evaluation to 4 Amperes Using Keysight E5270A AN E5270-1
This application note provides information how to obtain accurate results up to 4A using the E5270A and added flexible modules.

Application Note 2003-09-19

PDF PDF 739 KB
High Speed fT vs. Ic characterization of Bipolar transisitor Using E5270A and ENA AN E5270-2
This application note shows how to perform high-speed fT vs. Ic characterization of bipolar transistor by using Keysight E5270A and ENA series RF Network Analyzer.

Application Note 2003-08-10

Tips for Reusing Existing 4142B Program for Keysight E5270A Parametric Measurement Mainframe
The purpose of this technical overview is to provide an example of a systematic approach for finding non-operative 4142B program modules or lines in the E5270A instrument,,,

Application Note 2003-05-10

PDF PDF 310 KB