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Electronic Measurement

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2015 Insight Seminar Series
Two seminar series across Canada and US in 2015

Seminar

Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Insight Seminar Series – Core Bench Lab
Various locations in 2015

Seminar

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded