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Maximizing Battery Life of IoT Smart Devices with Keysight Solutions - Application Brief
This application brief details the design and test challenges involved with maximizing the battery life of Internet of Things (IoT) smart devices, and recommends Keysight solutions to address them.

Application Note 2016-07-14

PDF PDF 732 KB
Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2016-03-09

PDF PDF 619 KB
Improve the Accuracy and Efficiency for Organic-Thin Film Transistor (Organic-TFT) Characterization
This application note provides the technical information for the organic thin film transistor (OTFT) measurement using the B1500A Semiconductor Device Analyzer.

Application Note 2016-03-08

PDF PDF 2.96 MB
High-Current Ultra-Low Noise Filter Minimize B2961A/62A Power Source Noise Density
This 2-page Application Brief introduces N1294A-020 High Current Ultra Low Noise Filter suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2016-03-06

PDF PDF 1.11 MB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2016-03-04

PDF PDF 841 KB
Sheet Resistance/Resistivity Measurement Using a Source/Measurement Unit (SMU) - Application Note
This application note provides the technical information for the sheet resistance measurement using the precision current-voltage analyzer series.

Application Note 2016-01-14

PDF PDF 1.62 MB
LED IV Measurements Using the Keysight B2900A Series of SMUs - Application Note
This application note describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

Application Note 2016-01-04

Quick DC and Transient Evaluation of Switching Mode DC-DC Converter - Application Brief
This 3-page application brief introduces the example to make DC and Transient Evaluation of Switching Mode DC-DC Converter effectively using the Agilent B2900A Series of Precision Source/Measure Units.

Application Note 2015-12-17

PDF PDF 1.28 MB
Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2015-12-17

Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2015-12-17

PDF PDF 970 KB
Resistance Measurements Using the B2900A Series of SMUs - Application Note
This application note describes the use of the B2900 series of precision source/measure units for resistance measurements.

Application Note 2015-12-16

FET Characterization Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

Application Note 2015-12-15

IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

LIV Test of Laser Diode Using the B2900A Series of SMUs-Application Note
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2015-12-03

Diode Evaluation Using the B2900A Series of SMUs - Application Note
This application note shows how the Keysight B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

Application Note 2015-12-02

Optoelectronic IC/Component Evaluation - Application Brief
This 2-page application brief describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

Application Note 2015-11-24

Wide Range of Resistance Measurement Solutions from μΩ to PΩ - Application Brief
This application brief summarizes Keysight's resistance measurement solution. The detailed information can be seen 5992-1212EN application note.

Application Note 2015-11-18

Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Application Note 2015-11-17

Precision Device Characterization Solution Using the B2900A Series - Application Brief
This 2-page application brief introduces the precision device characterization solution using the B2900A precision source/measure unit.

Application Note 2015-11-11

Evaluating Adaptive Fast USB Battery Charging of Mobile Devices - Application Note
To offset greater power consumption, today’s mobile devices are now incorporating larger batteries; and the consequences are it takes longer to recharge due to the marginal power delivery of USB.

Application Note 2015-09-16

Evaluating Battery Run-Down with the N6781A 2-Quadrant Source/Measure Unit and the 14585A
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2015-05-29

How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2015-01-23

PDF PDF 829 KB
Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2015-01-23

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Customizing Keysight B1500A EasyEXPERT Application Tests - Application Note
This six-page application note shows how easy it is to change the input parameter range in a furnished B1500A application test.

Application Note 2014-07-31

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