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Electronic Measurement

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Ultra-Low Noise Filter Minimizes B2961A/62A Power Source Noise Density - Application Brief
This 2-page Application Brief introduces N1294A-021 Ultra Low Noise Filter which is suitable for the application requiring low noise power supply such as the evaluation of A/D Converter, Oscillator, Amplifiers.

Application Note 2014-01-27

PDF PDF 698 KB
Low Noise Filter Improves B2961A/62A Power Source Noise Performance - Application Brief
This 2-page application brief introduces N1294A-022 Low Noise Filter which enables the B2961A/62A to source clean voltage equivalent to that of much costlier precision linear voltage/current source instruments.

Application Note 2014-01-24

PDF PDF 543 KB
GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

Application Note 2013-09-30

SMU (Source/Measure Unit) for ICs and Electronic Components
This is introductory flyer for a series of "Quick Bench-top Evaluation" flyers scheduled to be developed every month until May or June 2012. B2900 series

Application Note 2013-05-24

MEMS Accelerometer Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of a MEMS accelerometer and shows real measurement results made by B2900A series.

Application Note 2013-05-24

Choosing System DC Power Supplies to Optimize System Integration and Performance - Application Note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

Application Note 2013-04-01

PDF PDF 476 KB
Thermistor Production Test Using the Keysight B2911A
This technical overview shows how to use the Keysight B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.

Application Note 2013-01-07

IV characterization of OLEDs using the Keysight B2911A
This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units.

Application Note 2013-01-07

Resistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.

Application Note 2013-01-07

Varistor Evaluation Using the Keysight B2900A Series
This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices.

Application Note 2013-01-07

LED Production Test Using the Keysight B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.

Application Note 2013-01-07

Fast fT-Ic Measurement Using the Keysight B2912A
This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements

Application Note 2013-01-07

Thermistor Evaluation Using the Keysight B2911A
This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices.

Application Note 2013-01-07

Varistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.

Application Note 2013-01-07

1500 A and 10 kV MOSFET Characterization using the Keysight B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2012-08-27

1500 A and 10 kV IGBT Characterization by using Keysight B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

Application Note 2012-07-27

Measuring Power BJT Electrical Characteristics using the B1505A - Application Note
B1505A can measure the typical DC and capacitance parameters of power BJT devices.

Application Note 2011-08-30

PDF PDF 493 KB
Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

Application Note 2011-08-22

PDF PDF 651 KB
AN B1505A-4 Direct Power MOSFET Capacitance Measurement at 3,000 V
This application note describes direct capacitance measurement at a 3,000 V bias voltage by using the Keysight B1505A.

Application Note 2011-01-10

PDF PDF 1.14 MB
AN B1500-17 A Complete CMOS Reliability Test Solution
This application note gives an overview of the B1500A's key measurement features and shows how the B1500A is a complete solution for verifying CMOS process reliability.

Application Note 2010-06-08

AN B1500A-2 Migrating from the Keysight 4155C and 4156C to the Keysight B1500A
This application note presents the B1500A's major features with EasyEXPERT 4.0 software and explains the differences and similarities with respect to the 4155C and 4156C.

Application Note 2010-04-02

AN B1500-16 A Complete Solution for CMOS Device Electrical Characterization
This application note gives an overview of the B1500A's key features and it goes on to show how the B1500A is a complete solution for CMOS device electrical characterization.

Application Note 2010-03-24

AN B1500-15 Ultra Low Current DC MOSFET Characterization at the Wafer Level
This application note describes how to precisely evaluate sub-threshold characteristics of a MOSFET device using B1500A’s ultra low current measurement capability

Application Note 2010-03-23

AN B1505-3 Precision Power Device Evaluation at 40 Amps
This application note introduces 40A IV measurement application for power devices by using two HCSMUs installed in the B1505A.

Application Note 2010-02-24

AN B1505-2 Next Generation Curve Tracer Revolutionizes Failure Analysis
This application note describes how the B1505A enable for checking device operation and failure analysis using curve tracer mode.

Application Note 2010-01-08

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