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Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

Notes d’application 2013-01-31

PDF PDF 440 KB
Test-System Development Guide: A Comprehensive Handbook for Test Engineers
Test-System Development Guide

Notes d’application 2012-05-07

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note

Notes d’application 2012-04-30

Getting Test Programs Up and Running Quickly with Driver Tracing and I/O Monitor
This note helps you create an example program and then shows you how to use driver tracing and IO Monitor to examine, verify and troubleshoot I/O activity in IVI-COM drivers.

Notes d’application 2009-05-05

Using IVI For Your Instrument Driver - Application Note
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Notes d’application 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

Tips for Optimizing Test System Performance in Linux Soft Real-Time Applications (AN 1465-31)
This application note offers several tips for optimizing the soft real-time performance of off-the-shelf Linux systems.

Notes d’application 2008-02-19

LXI Test System Provides Flexibility for Testing Automobile Antenna Amplifiers

Notes d’application 2007-10-30

PDF PDF 213 KB
Using Linux to Control LXI Instruments Through VXI-11 (AN 1465-28)
VXI-11 is one of two alternative protocols used by most LAN-based instruments. It is based on RPC (Remote Procedure Calls). This application note explains how VXI-11 works and discusses a number of programming examples.

Notes d’application 2007-07-08

Using Linux To Control LXI Instruments Through TCP (AN 1465-29)
TCP is one of two alternative protocols used by most LAN-based instruments. It is the more elegant from a programming standpoint. This application note explains how instrument control works through TCP.

Notes d’application 2007-06-13

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Notes d’application 2007-05-10

Using Linux in Your Test Systems: Linux Basics (AN 1465-27)
If you haven’t used Linux in test applications, this document will provide a detailed overview. Topics include: A brief Linux history, why use Linux, free tools available for application development and an instrument control overview.

Notes d’application 2007-05-08

Cathodic Protection of Steel in Concrete Using LXI
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Notes d’application 2007-04-25

PDF PDF 390 KB
Using LXI to Boost Throughput in Semiconductor Manufacturing
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Notes d’application 2007-04-25

PDF PDF 234 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Notes d’application 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

Using Synthetic Instruments in Your Test System (AN 1465-24)
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Notes d’application 2006-08-28

How to Use VXI and PXI in Your New LXI Test System (AN 1465-23)

Notes d’application 2006-06-06

Next-generation Test Systems: Advancing the Vision with LXI - Application Note
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Notes d’application 2006-05-03

Transitioning from GPIB to LXI (AN 1465-22)
This note compares GPIB and LXI, sketches hybrid system architectures, outlines a step-by-step approach to system set-up, and describes how to easily modify existing system software to work with LXI devices.

Notes d’application 2006-04-03

Using LXI to go beyond GPIB, PXI and VXI (AN 1465-20)
This application note focuses on the key attributes of the LXI standard, the major challenges in system development, the ways in which LXI addresses the key challenges, and the new possibilities in testing enabled by LXI devices.

Notes d’application 2006-01-17

Calibrating Signal Paths in RF/Microwave Test Systems (AN 1465-19)

Notes d’application 2005-10-31