Discutez avec un expert

Support technique

Mesure Electronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

1-12 sur 12

Sort:
Medalist i1000D Small Foot Print In-Circuit Test - Technical Overview
The Keysight Medalist i1000D is now fully automated with in-line capabilities. It is the smallest foot print in-circuit tester for PCBA lines.

Présentation technique 2014-08-03

Keysight System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Keysight's range of support products for in-circuit test, imaging inspection and functional test systems.

Fiche signalétique 2014-07-31

PDF PDF 858 KB
ICT System Support Delivery Options
Support delivery guidelines for Keysight In-circuit Test Systems.

Présentation technique 2012-10-16

PDF PDF 41 KB
i1000D Diagnostics Test Set - Technical Overview
The Keysight i1000 diagnostics test set (DTS) provides boundary scan, on-board programming and general digital test in a desktop form factor that makes it easy to deploy for a flexible test strategy.

Présentation technique 2012-03-26

Test Coverage Consultant - Data Sheet
The Keysight Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Keysight Test Coverage Consultant Keysight Medalist i3070 Series 5

Fiche signalétique 2011-07-14

PDF PDF 214 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Keysight Test Coverage Consultant up and running on your PC quickly.

Présentation technique 2010-11-17

System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

Fiche signalétique 2010-11-15

PDF PDF 201 KB
Keysight Support Agreement - Consumables Exclusion List for Alternative Functional Test
This data sheet provides a list of consumable parts not covered under the Keysight Support Agreements for In-Circuit Test, Functional Test, Automated X-Ray and Optical Inspection solutions.

Fiche signalétique 2010-07-16

PDF PDF 85 KB
Medalist i1000 In-Circuit Test System
Medalist i1000 in-circuit test (ICT) system is a low-cost in-circuit test solution for original design manufacturers who need “just-enough tests”.

Fiche signalétique 2010-06-21

Using Bead Probes to Increase Test Access
This case study discusses how Prodrive, a Netherlands-basedelectronics manufacturer, successfully implemented the Keysight Technologies Medalist Bead Probe Technology to complement their existing test strategies.

Fiche signalétique 2008-05-08

PDF PDF 366 KB
Manufacturing Test & Inspection Services & Support
Datasheet highlighting the new Medalist Support Program for Manufacturing Test & Inspection.

Fiche signalétique 2008-04-24

PDF PDF 226 KB
What is the Medalist i1000?
The Medalist i1000 in-circuit test (ICT) system answers the manufacturers’ need for a low cost ICT solution with just enough ICT tests. Read on to learn how it compares to traditional ICT.

Présentation technique 2007-11-12