聯絡是德專家

技術支援

電子量測

依產品型號搜尋: 例如: 34401A, E4440A

1-21 / 21

排序:
Medalist i3070 Series 5i Inline In-Circuit Test System – Data Sheet
Keysight’s Medalist i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

產品型錄 2013-09-03

x1149 Boundary Scan Analyzer - Technical Overview
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

技術總覽 2013-07-22

PDF PDF 1.24 MB
ICT System Support Delivery Options
Support delivery guidelines for Keysight In-circuit Test Systems.

技術總覽 2012-10-16

PDF PDF 41 KB
Medalist i3070 Series 5 In-Circuit Test System
The Keysight Medalist i3070 Series 5 In-Circuit Test (ICT) provides more flexible in incorporating external circuits as well as allowing better control of external circuits.

產品型錄 2012-09-25

i3070 High Node Count Test Solution - Technical Overview
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術總覽 2012-09-07

PDF PDF 261 KB
Medalist i3070 LED Test - Technical Overview
The Keysight Medalist i3070 light emitting diode test suite delivers excellent repeatability and accuracy in LED color and luminosity measurements and superior throughput during i3070 in-circuit test.

技術總覽 2012-05-16

PDF PDF 345 KB
Test Coverage Consultant - Data Sheet
The Keysight Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Keysight Test Coverage Consultant Keysight Medalist i3070 Series 5

產品型錄 2011-07-14

PDF PDF 214 KB
Smart Meter Test Solutions - Product Overview
As smart grid adoption increases, manufacturers of smart meters will need to adopt new and better test strategies and technologies to meet board and functional test requirements and stay competitive.

技術總覽 2010-11-29

PDF PDF 802 KB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Keysight Test Coverage Consultant up and running on your PC quickly.

技術總覽 2010-11-17

PDF PDF 242 KB
System Spares Onsite Agreement
This is the data sheet on system spares onsite agreement for uptime support

產品型錄 2010-11-15

PDF PDF 201 KB
Keysight System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Keysight's range of support products for in-circuit test, imaging inspection and functional test systems.

產品型錄 2010-08-06

PDF PDF 238 KB
Keysight Support Agreement - Consumables Exclusion List for Alternative Functional Test
This data sheet provides a list of consumable parts not covered under the Keysight Support Agreements for In-Circuit Test, Functional Test, Automated X-Ray and Optical Inspection solutions.

產品型錄 2010-07-16

PDF PDF 85 KB
Test Methods and Specifications for Keysight Medalist i3070 Series 5
The Keysight Medalist i3070 Series 5 In-Circuit Test (ICT) system enables incorporate external plug-in circuits.

產品型錄 2009-12-01

FR3070A Programming Board for Keysight Medalist In-Circuit Test Utility Card
FR3070A is a programming board that can be mounted on the Keysight Medalist In-Circuit Test System Utility Card.

產品型錄 2009-11-09

PDF PDF 257 KB
Utility Card for In-Circuit Test
This data sheet describes the optional pin card called the Keysight Utility Card that will fit in a card

產品型錄 2009-08-28

VTEP v2.0 Powered, with Cover-Extend Technology

技術總覽 2009-06-26

Medalist i3070 ICT Program and Fixture Conversion Solution
This document provides an overview on how users can re-use existing Teradyne test programs and fixtures when switching to the Keysight In-Circuit Test platform.

技術總覽 2008-05-16

PDF PDF 196 KB
Using Bead Probes to Increase Test Access
This case study discusses how Prodrive, a Netherlands-basedelectronics manufacturer, successfully implemented the Keysight Technologies Medalist Bead Probe Technology to complement their existing test strategies.

產品型錄 2008-05-08

PDF PDF 366 KB
Manufacturing Test & Inspection Services & Support
Datasheet highlighting the new Medalist Support Program for Manufacturing Test & Inspection.

產品型錄 2008-04-24

PDF PDF 226 KB
What is the Medalist i1000?
The Medalist i1000 in-circuit test (ICT) system answers the manufacturers’ need for a low cost ICT solution with just enough ICT tests. Read on to learn how it compares to traditional ICT.

技術總覽 2007-11-12

Medalist i3070 In-Circuit Test System
Product Specification for the Keysight Medalist i3070 is the next generation In-Circuit Test System (ICT).

產品型錄 2007-01-23