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Low-leakage Switch Matrix Mainframes (B2200A/B2201A/E5250A)

Find by Product Model Number: Examples: 34401A, E4440A

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The parametric Measurement Handbook
This handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2014-01-22

Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Keysight parametric measurement instruments.

Selection Guide 2013-12-09

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

Readme for VXIPlug&Play Driver Version A.04.00 for E5250A
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Release Notes 2011-12-19

E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

User Manual 2011-08-01

B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.

User Manual 2011-08-01

B2200A/B2201A Low-leakage Switching Mainframe
Learn about technical specifications for B2200A and B2201A Switch Mainframe.

Data Sheet 2009-02-25

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Switching Matrix Product Brochure
Product brochure for the B2200A, B2201A and E5250A low-leakage switching matrices

Brochure 2007-02-15

PDF PDF 1.27 MB
Solving the Most Difficult Switching Challenges
This 12-page color brochure details the features and competitive advantages of the Keysight family of low-leakage switches. It also contains a switching solutions selection guide with basic technical specifications.

Brochure 2006-11-08

PDF PDF 1.31 MB
AN B1500A-4 Customizing Keysight B1500A EasyEXPERT Application Test
This application note shows how easy it is to change the input parameter range in a furnished B1500A application test.

Application Note 2006-09-21

AN B1500A-5 Creating a Test Sequence Using Keysight B1500A EasyEXPERT Software
This 12-page application note demonstrates how a test sequence can be created using tests from the CMOS category using the furnished EasyEXPERT "Id-VD" and "Vth gmMax" application test definitions as an example.

Application Note 2006-08-01

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

What is the Keysight E5250A?
What is the Keysight E5250A?

Application Note 2002-12-18

PDF PDF 29 KB
How do I connect the GND unit Keysight 41501B with the Keysight E5250A?
How do I connect the GND unit Keysight 41501B with the Keysight E5250A?

Application Note 2002-12-18

PDF PDF 20 KB
How Do I Control the Keysight E5250A?
How Do I Control the Keysight E5250A?

Application Note 2002-12-18

HTML HTML 6 KB
E5250A Low-leakage Switch Mainframe
Information on configurations, specifications,and other technical data.

Application Note 2002-12-11

PDF PDF 112 KB
E5250A Low-leakage Switch Mainframe
Learn about technical specifications for E5250A Low-leakage Switch Mainframe.

Data Sheet 2000-12-01

E5250A Low Leakage Switch Mainframe Setup Guide
This Setup Guide describes the configuration for various applications. It also provides necessary information to order accessories for the E5250A.

Configuration Guide 2000-11-30

PDF PDF 1.83 MB
Evaluation of Hot Carrier Induced Degradation of Multiple MOSFET Devices. AN E5250A-2
This application note introduces you to Keysight’s new solution for evaluation of hot carrier induced degradation of multiple MOSFET devices.

Application Note 2000-11-05

Low Current Measurement with Keysight E5250A Switch Mainframe. AN E5250A-1
This application note introduces Keysight's new solution for precise characterization of multiple semiconductor devices by switching.

Application Note 2000-11-01