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EC-AFM: Engineered for Electrochemistry - Data Sheet

Data Sheet 2011-10-06

PDF PDF 411 KB
The Role of a Compact Low Voltage FE-SEM in Semiconductor Failure Analysis

Application Note 2011-10-04

PDF PDF 415 KB
Stereomicroscopy: 3D Imaging and the Third Dimension Measurement

Application Note 2011-09-19

PDF PDF 542 KB
Visualizing Carbon nanotubes with LV FE-SEM

Application Note 2011-09-06

PDF PDF 551 KB
Use Low Voltage FE-SEM to Overcome Challenges of Imaging Biological Specimens

Application Note 2011-08-31

PDF PDF 843 KB
Determining the Elastic Modulus of Thin Films: A Comparative Study of Substrate Accounting and Back
Discussion of elastic modulus of thin films while accounting for the substrate

Application Note 2011-08-30

PDF PDF 468 KB
Low Voltage FE-SEM Examination of Organic Polymers

Application Note 2011-08-24

PDF PDF 781 KB
Microscopic Characterization of Few-layer Hexagonal Boron Nitride: A promising Analogue Graphene

Application Note 2011-08-16

PDF PDF 801 KB
Measurement of System Compliance Using Template Grip Technique and the Keysight T150
System compliance using template grips for measuring mechanical properties of single fibers.

Application Note 2011-08-01

PDF PDF 229 KB
Mechanical Characterization of Grey & Brown Hair

Application Note 2011-07-20

PDF PDF 169 KB
For your convenience you can now register for a FREE PDF copy of your AFM User Manual

User Manual 2011-07-15

Stiffness Mapping and the Calculation of Fracture Toughness of Fused Silica
Fracture toughness measurement of fused silica using new stiffness methods.

Application Note 2011-06-05

PDF PDF 136 KB
Measuring the Mechanical Properties of Bone by Instrumented Indentation
Describes the use of instrumented indentation to measure the elastic modulus & hardness of bone

Application Note 2011-04-05

PDF PDF 219 KB
NanoSuite Software - Data Sheet
Overveiw of NanoSuite Indenter software with features and benefits

Data Sheet 2011-02-09

PDF PDF 407 KB
Measuring the Complex Modulus of Polyethylene Using Instrumented Indentation - Application Note
Application note demonstrating the new method for measurement of complex modulus of polyethylene.

Application Note 2011-01-19

PDF PDF 325 KB
High Temperature Mechanical Characterization of Tin Using Nanoindentation
A reveiw of a new test protocol for testing tin a high temperatures with the G200 using CSM & heating stage.

Application Note 2010-10-26

PDF PDF 463 KB
Substrate-Independent Modulus of Hard Overcoats for Magnetic Media

Application Note 2010-09-22

PDF PDF 203 KB
PFM Experiments with High Voltage DC/AC Bias

Application Note 2010-09-09

PDF PDF 562 KB
Measuring Substrate-Independent Young's Modulus

Application Note 2010-08-31

PDF PDF 347 KB
Measuring Substrate-Independent Young's Modulus of Low-k films by Instrumented Indentation

Application Note 2010-08-31

PDF PDF 263 KB
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization
Morphological Evolution of Sub-nanometer SiC Surface Steps upon Graphitization via Electron Channeling Contrast Imaging

Application Note 2010-08-06

PDF PDF 287 KB
Evaluation of Failure in Low-k Films Using Stiffness Mapping & Dynamic Imaging

Application Note 2010-08-03

PDF PDF 325 KB
Instrumented Indentation to Measure the Complex Modulus of Highly Plasticized Polyvinyl Chloride

Application Note 2010-07-29

PDF PDF 387 KB
Nanoindentation, Scratch, and Elevated Temperature Testing of Cellulose and PMMA Films
Review of nanomechanical methods for nanoindenting & scratch testingof films

Application Note 2010-04-16

PDF PDF 2.28 MB
Attofarad Capacitance Measurement with SMM

Application Note 2010-04-08

PDF PDF 325 KB

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