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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

Find by Product Model Number: Examples: 34401A, E4440A

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Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Application Note 2014-12-10

PDF PDF 2.33 MB
How to choose your MAC Lever - Technical Overview

Technical Overview 2014-12-09

PDF PDF 168 KB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Application Note 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Application Note 2014-12-08

PDF PDF 742 KB
Scanning Microwave Microscope Mode - Application Note

Application Note 2014-12-04

PDF PDF 320 KB
8500 FE-SEM System - Brochure

Brochure 2014-12-03

PDF PDF 1.29 MB
Temperature Control - Data Sheet

Data Sheet 2014-11-17

PDF PDF 491 KB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2014-11-13

PDF PDF 671 KB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Application Note 2014-11-07

PDF PDF 166 KB
Revolutionary Keysight Express Test Option for the Nano Indenter G200 - Data Sheet
Features, benefits and specifications for the Express Test Option for the G200 indenter

Data Sheet 2014-11-06

PDF PDF 473 KB
Liquid Cell and Sample Plate - Data Sheet

Data Sheet 2014-11-06

PDF PDF 891 KB
5600LS High Resolution Large Stage AFM - Data Sheet

Data Sheet 2014-11-06

PDF PDF 712 KB
PicoLITH, Keysight Lithography and Nanomanipulation Package – Data Sheet
Lithography and nanomanipulation software that provides for scanning probe microscopy (SPM) researchers. It allows users to sketch various shapes on a canvas (including lines, poly-lines, circles) that can then be mapped to a real sample surface.

Data Sheet 2014-11-03

PDF PDF 491 KB
MAC Mode - Data Sheet

Data Sheet 2014-11-03

PDF PDF 1.08 MB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Application Note 2014-09-04

PDF PDF 1.43 MB
7500 STM Scanner - Data Sheet

Data Sheet 2014-08-04

PDF PDF 801 KB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2014-08-02

PDF PDF 692 KB
Quantitative Mechanical Measurements at the Nano-Scale Using the DCMII - Application Note

Application Note 2014-07-31

PDF PDF 545 KB
Continuous Dynamic Analysis (CDA) Option - Data Sheet
Overview and specification of the CDA Option for the T150 UTM

Data Sheet 2014-07-31

PDF PDF 113 KB
Evaluation of Bearing Materials Using Nano-Scale Wear Testing - Application Note
This is a study of miniature ball bearings made of steel, polytetrafluoroethylene (PTFE) reinforced with graphite, and polyether ether ketone (PEEK) are evaluated by means of nano-indentation and nano- wear testing

Application Note 2014-06-20

PDF PDF 1.08 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2014-06-02

PDF PDF 1.59 MB
Introduction to SECM and Combined AFM-SECM - Application Note

Application Note 2014-05-07

PDF PDF 962 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note

Application Note 2014-05-07

PDF PDF 1.44 MB
7500 ILM Atomic Force Microscope (AFM) - Data Sheet
The 7500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope (AFM) with the direct optical viewing capability of an inverted optical microscope.

Data Sheet 2014-05-07

PDF PDF 135 KB

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