Contact an Expert

Technical Support

Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

Find by Product Model Number: Examples: 34401A, E4440A

51-75 of 203

Sort:
On Characterization of Mechanical Deformation in Flexible Electronic Structures
Demonstrates how the Keysight T150 UTM has been successfully utilized to characterize nano/micro-mechanical failure in inorganic thin films on flexible substrates.

Application Note 2012-08-28

PDF PDF 634 KB
Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity Application Note

Application Note 2012-08-02

PDF PDF 470 KB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers

Application Note 2012-07-13

PDF PDF 310 KB
Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61) - Application Note
Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61.

Application Note 2012-07-13

PDF PDF 155 KB
Imaging Organic & Biological Materials with Low Voltage Scanning Electron Microscopy

Application Note 2012-06-27

PDF PDF 666 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
Different Contrast Mechanisms in SEM Imaging of Graphene

Application Note 2012-06-26

PDF PDF 380 KB
Imaging Graphene via low-voltage Field Emission Scanning Electron Microscopy

Application Note 2012-06-26

PDF PDF 1007 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges

Application Note 2012-06-13

PDF PDF 426 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films - Application Note
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.

Application Note 2012-06-12

PDF PDF 448 KB
SMM Imaging of Dopant Structures of Semiconductor Devices

Application Note 2012-05-21

PDF PDF 434 KB
Mapping the Mechanical Properties - Application Note
Overview of Mapping mechanical properties of 2205 Duplex Stainless Stell Using the NEW Express Test.

Application Note 2012-04-23

PDF PDF 289 KB
Quantitative Surface Potential Measurement Using KFM

Application Note 2012-04-20

PDF PDF 433 KB
Tensile Deformation of Fibers Used in Textile Industry
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Application Note 2012-04-02

PDF PDF 812 KB
Rapid Mechanical Characterization - Application Note
Overview of Express Test on G200 used to perform an array of 40x40 indents in order to map the hardness and elastic modulus of a sectioned fiberglass computer board over a 40µm x 40µm area. The 1600 indents were completed in less than 26 minutes.

Application Note 2012-04-02

PDF PDF 258 KB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Application Note 2012-03-22

PDF PDF 146 KB
Revolutionary New Keysight Express Test Option
Features, benefits and specifications for the Express Test Option for the G200 indenter

Data Sheet 2012-03-22

PDF PDF 199 KB
Determination of Critical Tearing Energy of Polymer Films
Overview of critical tearing energy for two commercially available polymer tapes that are measured from trouser-tear tests. The capability of measuring small loads, along with the high force resolution, enabled us to capture the variations in force during tearing of thin polymer films

Application Note 2012-03-22

PDF PDF 203 KB
Tensile Stress-Strain Response of Small Diameter Electrospun Fibers
Overview of characterization of tensile stress-strain behavior of small diameter electrospun fibers of PCL using the Keysight UTM T150

Application Note 2012-03-20

PDF PDF 211 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

Application Note 2012-03-13

PDF PDF 389 KB
FE-SEM Image Library

Demo 2012-01-11

AFM Image Library

Demo 2012-01-11

Nanoindenter Bibliography

Demo 2012-01-11

AFM Bibliography

Demo 2012-01-11

Previous 1 2 3 4 5 6 7 8 9 Next