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Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Application Note 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

Application Note 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

Application Note 2016-10-11

PDF PDF 1.13 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Application Note 2016-07-13

PDF PDF 1.64 MB
Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

Application Note 2016-06-07

PDF PDF 1.75 MB
9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research

Application Note 2016-05-23

PDF PDF 2.16 MB
Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.

Application Note 2016-04-25

PDF PDF 2.08 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2016-03-11

PDF PDF 7.96 MB
Nanoindentation of a Multiphase Composite with NanoVision - Application Note
Review of Nanoindetation of a multicomposite using Nanovision

Application Note 2015-08-28

PDF PDF 176 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2015-05-04

PDF PDF 624 KB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2015-05-04

PDF PDF 343 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2015-05-03

PDF PDF 1.38 MB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2015-04-30

PDF PDF 552 KB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2015-04-30

PDF PDF 521 KB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Application Note 2015-04-30

PDF PDF 2.75 MB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Application Note 2015-04-28

PDF PDF 2.67 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Application Note 2015-04-28

PDF PDF 4.95 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Application Note 2015-04-28

PDF PDF 967 KB

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