Discutez avec un expert

Support technique

Mesure Electronique

Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

Affiner la liste

retirer tout le raffinement

Par type de contenu

1-25 sur 166

Tri:
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Notes d’application 2015-02-24

PDF PDF 4.76 MB
Different Contrast Mechanisms in SEM Imaging of Graphene - Application Note

Notes d’application 2015-02-24

PDF PDF 1.75 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note

Notes d’application 2015-02-20

PDF PDF 3.66 MB
Introduction to Scanning Microwave Microscopy - Application Note

Notes d’application 2015-02-12

PDF PDF 1.49 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Notes d’application 2015-02-02

PDF PDF 1.57 MB
Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Notes d’application 2015-01-28

PDF PDF 778 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Notes d’application 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Notes d’application 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Notes d’application 2015-01-17

PDF PDF 1.92 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Notes d’application 2015-01-11

PDF PDF 607 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Notes d’application 2015-01-11

PDF PDF 1.02 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Notes d’application 2015-01-07

PDF PDF 7.95 MB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Notes d’application 2014-12-29

PDF PDF 1.33 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Notes d’application 2014-12-29

PDF PDF 495 KB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence.

Notes d’application 2014-12-18

PDF PDF 610 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Notes d’application 2014-12-16

PDF PDF 2.06 MB
Lithium/Polymer Battery Mapping-Express Test - Application Note
Investigation of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Notes d’application 2014-12-16

PDF PDF 1.90 MB
Electrical Measurement - Application Note
Overview of electrical measurements using AFM in various modes

Notes d’application 2014-12-15

PDF PDF 4.11 MB
SMM Imaging of Dopant Structures of Semiconductor Devices - Application Note

Notes d’application 2014-12-10

PDF PDF 2.33 MB
Attaching Antibodies to AFM Probes with Sulfhydryl Reactive PEG Tether NHS-PEG18-PDP - App Note

Notes d’application 2014-12-08

PDF PDF 329 KB
Attaching Antibodies to MAC Levers with the Bifunctional Amine-Amine Reactive PEG Tether - App Note

Notes d’application 2014-12-08

PDF PDF 742 KB
Scanning Microwave Microscope Mode - Application Note

Notes d’application 2014-12-04

PDF PDF 320 KB
Rapid Characterization of Elastic Modulus - Application Note
Overview of Express Test Option for G200 NanoIndenter and how it increases instrument productivity by more than two orders of magnitude with ultra-fast indentation.

Notes d’application 2014-11-07

PDF PDF 166 KB
Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy - Application Note

Notes d’application 2014-09-04

PDF PDF 1.43 MB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Notes d’application 2014-08-02

PDF PDF 692 KB

1 2 3 4 5 6 7 Page suivante