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Nano-Mechanical Measurements for Automotive Industry - Brochure
The Keysight Nano Indenter G200 provides the most comprehensive solutions of quantitative, high-throughput nanomechanical characterization for automotive industry.

Brochure 2017-09-13

PDF PDF 11.91 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

Application Note 2017-08-21

PDF PDF 657 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Nano Indenter G200 - Data Sheet
Overview and specifications for the Nano Indenter G200

Data Sheet 2017-08-04

PDF PDF 1.72 MB
High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

Application Note 2017-07-31

PDF PDF 524 KB
Laser Heated Tip and High Temperature Stage for G200 Nano Indenter - Data Sheet
General information and specifications for the G200 Nano Indenter Laser Heater Tip and Stage

Data Sheet 2017-07-06

PDF PDF 2.81 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Application Note 2017-06-15

PDF PDF 3.96 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-06-12

PDF PDF 8.01 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

Data Sheet 2017-03-29

5600LS High Resolution Large Stage AFM - Data Sheet

Data Sheet 2017-03-20

PDF PDF 4.85 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Application Note 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

Application Note 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

Application Note 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

Brochure 2016-09-22

PDF PDF 4.63 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the new digital controller with the 5500 AFM

Data Sheet 2016-09-12

PDF PDF 685 KB
9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

Data Sheet 2016-09-06

PDF PDF 3.36 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Surface observation The nano-scale surface observation solution for semiconductor wafer/die, resist,
Keysight’s small footprint yet powerful benchtop high resolution SEM lets you image nonconductive or energy sensitive surfaces and shortens preparation time before observation, saving space, time and costs.

Brochure 2016-07-28

PDF PDF 360 KB

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