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Nano Indenter G200 - Data Sheet
Overview and specifications for the Nano Indenter G200

Fiche signalétique 2017-08-04

PDF PDF 1.72 MB
High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

Notes d’application 2017-07-31

PDF PDF 524 KB
Laser Heated Tip and High Temperature Stage for G200 Nano Indenter - Data Sheet
General information and specifications for the G200 Nano Indenter Laser Heater Tip and Stage

Fiche signalétique 2017-07-06

PDF PDF 2.81 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Notes d’application 2017-06-15

PDF PDF 3.96 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Notes d’application 2017-06-12

PDF PDF 8.01 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Notes d’application 2017-04-18

PDF PDF 1.80 MB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

Fiche signalétique 2017-03-29

5600LS High Resolution Large Stage AFM - Data Sheet

Fiche signalétique 2017-03-20

PDF PDF 4.85 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Notes d’application 2017-03-09

PDF PDF 4.15 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Notes d’application 2017-03-09

PDF PDF 5.29 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Notes d’application 2017-03-09

PDF PDF 6.24 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Notes d’application 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Notes d’application 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

Notes d’application 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

Notes d’application 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

Brochure 2016-09-22

PDF PDF 4.63 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the new digital controller with the 5500 AFM

Fiche signalétique 2016-09-12

PDF PDF 685 KB
9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

Fiche signalétique 2016-09-06

PDF PDF 3.36 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Notes d’application 2016-08-30

PDF PDF 2.89 MB
Surface observation The nano-scale surface observation solution for semiconductor wafer/die, resist,
Keysight’s small footprint yet powerful benchtop high resolution SEM lets you image nonconductive or energy sensitive surfaces and shortens preparation time before observation, saving space, time and costs.

Brochure 2016-07-28

PDF PDF 360 KB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Notes d’application 2016-07-15

PDF PDF 3.31 MB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Notes d’application 2016-07-13

PDF PDF 1.64 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Fiche signalétique 2016-07-02

PDF PDF 2.89 MB
Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

Notes d’application 2016-06-07

PDF PDF 1.75 MB
9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research

Notes d’application 2016-05-23

PDF PDF 2.16 MB

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