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Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Application Note 2015-03-23

PDF PDF 5.80 MB
7500 STM Scanner - Data Sheet

Data Sheet 2015-03-23

PDF PDF 104 KB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-03-22

PDF PDF 1.02 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

Application Note 2015-03-13

PDF PDF 8.09 MB
Young’s Modulus of Dielectric ‘Low-k’ Materials - Application Note
Overview of Youngs Modulus in the nanomechanical testing of dielectic low-k materials as deposited on silicon

Application Note 2015-03-12

PDF PDF 536 KB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2015-03-11

PDF PDF 5.74 MB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Application Note 2015-03-11

PDF PDF 5.66 MB
Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission

Application Note 2015-02-24

PDF PDF 4.76 MB
Different Contrast Mechanisms in SEM Imaging of Graphene - Application Note

Application Note 2015-02-24

PDF PDF 1.75 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note

Application Note 2015-02-20

PDF PDF 3.66 MB
Introduction to Scanning Microwave Microscopy - Application Note

Application Note 2015-02-12

PDF PDF 1.49 MB
High Resolution Scanning Probe Microscopy in Controlled Environments - Application Note
This Application Note reports investigations involving high resolution SPM experiments with Keysight Technologies SPMs working in a glove box environment without compromising the SPM performance.

Application Note 2015-02-02

PDF PDF 1.57 MB
Mapping the Mechanical Properties of SAC 305 Solder with Express Test - Application Note
The note discusses the use of nano-indentation to map the mechanical properties of a SAC 305 solder joint, because electronic reliability depends on mechanical integrity. Traditional nano-indentation testing time for such mapping, would have been prohibitively long but with the Express Test we were able to generate quantitative and highly resolved hardness maps in about an hour.

Application Note 2015-01-28

PDF PDF 778 KB
8500B Field-Emission Scanning Electron Microscope - Data Sheet
Features, benefits and specifications for the 8500B FE-SEM

Data Sheet 2015-01-22

PDF PDF 265 KB
SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
Measuring Stress-Strain Curves for Shale Rock by Dynamic Instrumented Indentation - Application Note
Study of Dynamic instrumented indentation as an ideal way to measure the mechanical properties of shale rock. Note includes samples that can be just a few millimeters in extent, and shows that ion-milling is an adequate method of surface preparation. The note proves that test forces greater than 300mN, the primary results (reduced modulus and hardness) are accurate, repeatable, and relevant.

Application Note 2015-01-19

PDF PDF 1.17 MB
A Comparative Microscopy Imaging Study on Tissue Specimens - Application Note

Application Note 2015-01-17

PDF PDF 1.92 MB
Introduction to SECM and Combined AFM-SECM - Application Note
Introduction to Scanning electrochemical microscopy (SECM) is a powerful scanning probe technique, which is suitable for investigating surface reactivity, and processes at the solid/liquid as well as liquid/liquid interface.

Application Note 2015-01-11

PDF PDF 607 KB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2015-01-07

PDF PDF 7.95 MB
Mechanical Properties Measurement on Individual Composite Micro-Fibers - Application Brief
Study of characterization of mechanical properties of bicomponent micro-fibers, consisting of nylon 6 nano-islands in a PET sea, under tensile loading.

Application Note 2014-12-29

PDF PDF 495 KB
7500 Atomic Force Microscope (AFM) - Data Sheet

Data Sheet 2014-12-29

PDF PDF 4.40 MB
Mechanical Characterization of Sol Gel Coatings Using a Nano Indenter G200 - Application Note
A case study on Nanomechanical Characterization of Sol Gel Coatings.

Application Note 2014-12-29

PDF PDF 1.33 MB
Effect of Annealing on 50nm Gold Films - Application Note
Overview of Express Test used to evaluate the effect of annealing on 50nm gold films. The note proves that vacuum annealing for three hours (sub 300°C) causes the hardness to decrease by 4.3% – 6.7% with99.9% confidence.

Application Note 2014-12-18

PDF PDF 610 KB
Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Application Note

Application Note 2014-12-16

PDF PDF 2.06 MB
Lithium/Polymer Battery Mapping-Express Test - Application Note
Investigation of the the mechanical properties of a lithium rechargeable battery cathode by using both the classic XP CSM and the new DCM Express Test method.

Application Note 2014-12-16

PDF PDF 1.90 MB

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