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Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

Data Sheet 2017-03-29

5600LS High Resolution Large Stage AFM - Data Sheet

Data Sheet 2017-03-20

PDF PDF 4.85 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

Application Note 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

Application Note 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

Application Note 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

Brochure 2016-09-22

PDF PDF 4.63 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the new digital controller with the 5500 AFM

Data Sheet 2016-09-12

PDF PDF 685 KB
9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

Data Sheet 2016-09-06

PDF PDF 3.36 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

Application Note 2016-08-30

PDF PDF 2.89 MB
Surface observation The nano-scale surface observation solution for semiconductor wafer/die, resist,
Keysight’s small footprint yet powerful benchtop high resolution SEM lets you image nonconductive or energy sensitive surfaces and shortens preparation time before observation, saving space, time and costs.

Brochure 2016-07-28

PDF PDF 360 KB
Mechanical characteristics analysis Nano-scale verification solution for softer materials and semico
Keysight’s unique nanoscale electromagnetic actuator realizes load control from N level to nN level, supporting a wide range of materials used in automotive parts, from rigid film to thin film materials like resin or semiconductor that need shallow depth indentation.

Brochure 2016-07-26

PDF PDF 380 KB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Application Note 2016-07-13

PDF PDF 1.64 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

Data Sheet 2016-07-02

PDF PDF 2.89 MB
Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

Application Note 2016-06-07

PDF PDF 1.75 MB
Nano Indenter G200 - Data Sheet
Overview and specifications for the Nano Indenter G200

Data Sheet 2016-06-06

PDF PDF 1.90 MB
9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research

Application Note 2016-05-23

PDF PDF 2.16 MB
Advanced Nanomeasurement Solutions - Brochure
High level nanotechnology brochure discussing AFM, FE-SEM and Nanomechanical Testing Systems capabilities across industries and research areas.

Brochure 2016-05-06

PDF PDF 7.07 MB
Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.

Application Note 2016-04-25

PDF PDF 2.08 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

Application Note 2016-03-11

PDF PDF 7.96 MB

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