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9500 AFM - Data Sheet
Data sheet for the new 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

Data Sheet 2015-06-25

PDF PDF 2.83 MB
Keysight AFM 9500 Demo Video

Demo 2015-06-25

Advanced Nanomeasurement Solutions

Brochure 2015-06-24

PDF PDF 856 KB
8500B Field-Emission Scanning Electron Microscope - Data Sheet
Features, benefits and specifications for the 8500B FE-SEM

Data Sheet 2015-05-22

PDF PDF 1.78 MB
8500 FE-SEM System - Brochure

Brochure 2015-05-19

PDF PDF 1.19 MB
The Revolutionary Impact of the Oliver and Pharr Technique - Application Note
Explanation of the Oliver-Pharr method and how it can be used to obtain an equivalent Vickers hardness number

Application Note 2015-05-04

PDF PDF 343 KB
Tribology of Dental Enamel: Effect of Etching - Application Brief
In this summary, the nano-tribological behavior of the dental enamel as a function of acid etching is characterized using a nanoindenter.

Application Note 2015-05-04

PDF PDF 624 KB
Strain-Rate Sensitivity of Thin Metal Films by Instrumented Indentation – Application Note
A new technique for measuring strain-rate sensitivity by instrumented indentation is presented. This new technique is insensitive to thermal drift and can be used for thin films and other small volumes materials

Application Note 2015-05-03

PDF PDF 1.38 MB
In Situ Young’s Modulus and Strain-Rate Sensitivity of Lead Free SAC 105 Solder - Application Note
Overview of how to improve the mechanical reliability of solder joints in integrated circuits, by instrumented indentation to measure the Young’s modulus (E) and strain-rate sensitivity (m) of a common lead-free solder alloy.

Application Note 2015-04-30

PDF PDF 521 KB
How Much Indentation Testing is enough testing? - Application Note
Overview of how much testing is required to conclude a significant difference between two observation sets at a particular confidence level.

Application Note 2015-04-30

PDF PDF 552 KB
Tensile Deformation of Fibers Used in Textile Industry - Application Note
Discussion of UTM T150 used to test four different individual textile fibers — cotton, wool, polyester and rayon — under tensile loading.

Application Note 2015-04-30

PDF PDF 2.75 MB
Performance and Control of the Keysight Nano Indenter DCM - Application Note
Overview of the DCM performance and control on the G200

Application Note 2015-04-28

PDF PDF 4.95 MB
Mechanical Testing of Shale by Instrumented Indentation - Application Note
Case study of acquiring mechanical properties of fractures in shale

Application Note 2015-04-28

PDF PDF 2.67 MB
Mechanical Testing of Carbon Nanotube Arrays - Application Note
Application note explores the mechanical Testing of Carbon Nanotube Arrays and shows the mode deformation and unusal features in the force displacement data.

Application Note 2015-04-28

PDF PDF 967 KB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

Application Note 2015-04-10

PDF PDF 2.99 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

Application Note 2015-04-10

PDF PDF 2.90 MB
Potential of Low Voltage Scanning Electron Microscopy Use in Archaeology/History of Art - App Note

Application Note 2015-04-08

PDF PDF 6.94 MB
Nanomeasurement Instruments for Industry R&D - Brochure
This brochure discusses nanomeasurement instruments for industry R&D.

Brochure 2015-04-08

PDF PDF 1.53 MB
7500 STM Scanner - Data Sheet

Data Sheet 2015-03-23

PDF PDF 104 KB
Atomic Force Microscopy Studies in Various Environments - Application Note
Overview of using the environmental chamber with water, humidity and gaseous vapors in Polymer research

Application Note 2015-03-23

PDF PDF 5.80 MB
Combining Atomic Force Microscopy with Scanning Electrochemical Microscopy - Application Note
Application note discussing the combined AFM-SECM approach with bifunctional probe provides topographical and correlated electrochemical information with high spatial and temporal resolution, thereby enabling the transformation of scanning probe microscopic techniques into multifunctional devices.

Application Note 2015-03-22

PDF PDF 1.02 MB
Compositional Mapping of Materials with Single Pass Kelvin Force Microscopy - Application Note
Applications of single-pass KFM showing that the mode complements phase imaging in compositional mapping of complex materials.

Application Note 2015-03-13

PDF PDF 8.09 MB
Young’s Modulus of Dielectric ‘Low-k’ Materials - Application Note
Overview of Youngs Modulus in the nanomechanical testing of dielectic low-k materials as deposited on silicon

Application Note 2015-03-12

PDF PDF 536 KB
The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Application Note 2015-03-11

PDF PDF 5.66 MB
Imaging Graphene via Low Voltage Field Emission Scanning Electron Microscopy - Application Note
Review of the excellent imagaing capabilities of low-voltage SEM for morphology invertigation of graphene

Application Note 2015-03-11

PDF PDF 5.74 MB

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