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Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

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Temperature-Dependent Characterization for Device R&D Webcast
Recorded broadcast April 22, 2016

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Keysight's live webcasts
Stay up to date by bookmarking this page to see the latest information on Keysight's webcasts.

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Fundamentals of Materials Measurement and Characterization Webcast
Original broadcast January 20, 2016

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Fundamentals of Wavelength Dependent Optical Component Testing Webcast
Original broadcast September 29, 2015

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Successfully Make Power and AC Line Disturbance Measurements Webcast
Original broadcast June 25, 2015

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Automating Semiconductor and Power Semiconductor Device Testing Webcast
Original broadcast June 24, 2015

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Optimizing Battery Run and Charge Times of Today’s Mobile Wireless Devices Webcast
Original broadcast June 18, 2015

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Non-destructive testing of powders, ceramic, oils, & other composite materials
Original broadcast December 11, 2014

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Fundamentals of Fast Pulsed IV Measurement Webcast
Original broadcast January 9, 2014

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Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

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Measuring Complex Materials and their Components Seminar 2013
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

Семинар

1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices.
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

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1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

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