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Electronic Measurement

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Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2015-01-23

How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2015-01-23

PDF PDF 829 KB
Low-Dropout (LDO) Linear Regulator Evaluation - Product Fact Sheet
This 2-pager describes "Quick Bench-top Evaluation" of an LDO linear regulator and shows real measurement results made by B2900A series.

Application Note 2014-11-10

PDF PDF 333 KB
Precise Evaluation of Input,Output, and Reverse Transfer Capacitances of Power Devices - White Paper
Accurate characterization of power device capacitance parameter becomes important for power circuit design. This paper introduces a solution to characterize Ciss, Coss, Crss and Rg automatically.

Application Note 2014-10-10

PDF PDF 2.49 MB
Selecting Best Device for Power Circuit Design Through Gate Charge Characterization - White Paper
The gate charge (Qg) parameter becomes more important for reducing power loss of devices working under high frequency switching. This article proposes a new and innovative Qg measurement technique.

Application Note 2014-07-03

PDF PDF 343 KB
Internal Gate Resistance Measurement Using the Agilent B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2014-05-27

PDF PDF 246 KB
IGBT Sense Emitter Current Measurement Using the Agilent B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2014-05-27

PDF PDF 201 KB
Thyristor Characterization Using the Agilent B1505A - Application Note
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2014-05-19

PDF PDF 347 KB
GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

Application Note 2013-09-30

The Impedance Measurement Handbook-4th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2013-09-10

DC-DC Converter Evaluation - Flyer
This 1-pager describes "Quick Bench-top Evaluation" of DC-DC converter and shows real measurement results of DC and transient tests made by B2900A series.

Application Note 2013-08-29

PDF PDF 1.04 MB
SMU (Source/Measure Unit) for ICs and Electronic Components
This is introductory flyer for a series of "Quick Bench-top Evaluation" flyers scheduled to be developed every month until May or June 2012. B2900 series

Application Note 2013-05-24

MEMS Accelerometer Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of a MEMS accelerometer and shows real measurement results made by B2900A series.

Application Note 2013-05-24

Optoelectronic IC/Component Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

Application Note 2013-05-23

PDF PDF 281 KB
Thermistor Production Test Using the Keysight B2911A
This technical overview shows how to use the Keysight B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.

Application Note 2013-01-07

Characterization of Bipolar Transistors Using the Keysight B2912A
This technical overview describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2013-01-07

LED IV Measurement Using the Keysight B2911A
This technical overview describes the use of LED IV measurements using the B2900 Series Precision source/measure unit.

Application Note 2013-01-07

Fast fT-Ic Measurement Using the Keysight B2912A
This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements

Application Note 2013-01-07

LIV Test of Laser Diode Using the Keysight B2912A
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2013-01-07

Resistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.

Application Note 2013-01-07

Characterization of Field Effect Transistors Using the Keysight B2912A
The Keysight B2900A Series Precision SMU allows you to evaluate IV characteristics of FET accurately and quickly with its intuitive GUI and free PC-based application software.

Application Note 2013-01-07

LED Production Test Using the Keysight B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.

Application Note 2013-01-07

Varistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.

Application Note 2013-01-07

Varistor Evaluation Using the Keysight B2900A Series
This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices.

Application Note 2013-01-07

IV characterization of OLEDs using the Keysight B2911A
This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units.

Application Note 2013-01-07

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