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Electronic Design Automation Software

Find by Product Model Number: Examples: 34401A, E4440A

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Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Demo 2015-03-24

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

Reference Guide 2015-03-20

5G Channel Sounding
This video discusses Keysight's This video discusses Keysight's mmWave MIMO channel sounding solution for 5G. 5G is aiming to achieve gigabytes per second data rate anywhere, anytime, and to get there, we need to use new technologies such as massive MIMO and millimeter wave broadband. solution for 5G. 5G is aiming to achieve gigabytes per second data rate anywhere, anytime, and to get there, we need to use new technologies such as massive MIMO and millimeter wave broadband.

Demo 2015-03-19

A Nonlinear Model Complier for RF/MICROWAVE Engineers
This Article presents Genesys latest release which includes a powerful Verilog-A compiler technology and hence enhancing the accuracy of simulation.

Article 2015-03-18

PDF PDF 536 KB
WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2015-03-15

PDF PDF 1.49 MB
How to Design an RF Power Amplifier: Class E
This video provides an introduction to Class E Power Amplifiers and demonstrates a superior, time saving methodology to design and practically realize a Class E RF power amplifier using first principles to build an ideal circuit and then utilizing circuit design tools to synthesize a more realistic circuit topology from the ideal case.

How-To Video 2015-03-11

How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.

How-To Video 2015-03-10

Keysight 5G signal generation and analysis demonstration at Mobile World Congress
Keysight demonstrates candidate 5G FBMC waveform co-existence with 4G LTE, and up to 2GHz wideband FBMC signal generation and analysis using SystemVue W1906 5G library, N7608B Signal Studio for custom modulation, and 89600 VSA software applications with Keysight wideband test equipment.

Demo 2015-03-09

Digital Design & Interconnect Standards - Brochure
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2015-03-09

PDF PDF 7.71 MB
Keysight 5G Millimeter-Wave Channel Sounding demonstration at Mobile World Congress
Keysight demonstrates a multi-channel Channel Sounding system at milimeter-wave frequencies, to enable 5G research and system validation

Demo 2015-03-09

Keysight Technologies to Demonstrate Latest EMC Design, Test Tools at EMCSI Symposium
Keysight announces it will demonstrate and discuss the latest tools and techniques on 1) EMC design and testing, and 2) signal and power integrity at the EMCSI 2015 Symposium, Santa Clara Convention Center, Booth 618, March 17-19.

Press Materials 2015-03-09

Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2015-03-04

How to Predict Package and Bondwire Effects on Your RF-Module Designs
This short video shows how to predict package, board, and bond wire effects on your RF-module designs which subsequently enables you to fix the design prior going to fabrication. The video demonstrates the process of building modules that comprise different technologies and performing EM simulation on them.

How-To Video 2015-02-19

Genesys - Brochure
12-page Genesys color brochure and configuration guide. Provides information to help with purchasing decisions and justifications.

Brochure 2015-02-15

PDF PDF 7.40 MB
E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

Data Sheet 2015-02-13

PDF PDF 1.02 MB
How to Use Envelope Tracking to Improve Power Amplifier Efficiency
This video introduces basic concepts regarding applying envelope tracking to improve power amplifier efficiency.

How-To Video 2015-02-10

Recommendations for Port Setup When Using ADS Momentum and Modelithics Models
This application note is intended to help Advanced Design System (ADS) users using Modelithics models, simulate RF & Microwave circuits. The focus is on finding the optimum port setup for EM simulation of circuit layouts that include surface-mount technology (SMT) devices.

Application Note 2015-02-05

PDF PDF 1.43 MB
How to Design an RF Power Amplifier: Class F
This short video will provide an introduction to Class F Power Amplifier Design by first building a nonlinear device model and then using this model in a circuit simulation environment to generate the idealized “square” Class F waveforms.

How-To Video 2015-01-27

How to Make Accurate, Automated RF Wafer-level Measurements
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

How-To Video 2015-01-27

How to Setup and Run Load Pull Simulations: The Basics
This video introduces basic concepts regarding running load pull simulations. It then uses load pull simulation to find a load impedance that enables you to obtain greater than 43 dBm output power and greater than 55% PAE from a Cree FET.

How-To Video 2015-01-27

HDMI and DisplayPort Design and Test – A Better Way - Brochure
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
High Speed Digital Products: Comparison Chart
High Speed Digital Products: Comparison Chart

Selection Guide 2015-01-21

SMM EMPro - Application Note
In this application note, we describe electromagnetic (EM) simulations using Keysight Technologies’ EMPro software to support the interpretation of scanning microwave microscope (SMM) experiments.

Application Note 2015-01-20

PDF PDF 2.43 MB
LTE Reference Vector
A fresh approach to Comms PHY system design challenges.

Application Note 2015-01-20

PDF PDF 270 KB
How to Characterize and Optimize Connector to Board Transition Designs
This video demonstrates how to accurately model an SMA to PCB transition to obtain agreement between simulated and measured results and how to improve the transition performance.

How-To Video 2015-01-15

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