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Electronic Measurement

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IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-08-04

PDF PDF 8.20 MB
Wafer-level Measurement Solutions – Cascade Microtech
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

Quick Start for Signal Integrity Design Using Advanced Design System (ADS) – Technical Overview
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

Technical Overview 2014-08-04

PDF PDF 3.82 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
Keysight EEsof EDA Customer Support - Brochure
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2014-08-03

PDF PDF 175 KB
Keysight EEsof EDA License Configuration Guide
This guide provides an overview of Keysight EEsof EDA licensing options which can help a user choose the appropriate product and license configuration that best suits their needs.

Configuration Guide 2014-08-03

Solutions for Emerging 4G and WLAN Communications Systems - Application Note
This “Solutions for Emerging 4G and WLAN Communication Systems” application note explains how making Digital Pre-Distortion fast and practical for all engineers.

Application Note 2014-08-03

EDA Support Services - Flyer
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2014-08-03

PDF PDF 454 KB
Keysight EEsof EDA Software and Modular Solutions for Universities
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program - Brochure
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

Brochure 2014-08-03

PDF PDF 562 KB
FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products
This paper presents a novel simulation methodology to model the coupling between a GTEM cell and an RF-ID antenna.

Article 2014-08-03

PDF PDF 816 KB
Faster Validation with Design and Test Integration - Brochure
Keysight's RF workflow environment is the comprehensive way to simulate, measure and analyze communications components and systems. This 8pg brochure covers several examples.

Brochure 2014-08-03

PDF PDF 967 KB
Using SystemVue for Integrating Wireless PHY Design, Validation, and Test
Keysight SystemVue integrates system-level design tasks such as DSP modeling and Algorithm development with Validation and Test to create a unique new design flow for communications physical layer.

Application Note 2014-08-03

PDF PDF 5.89 MB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation
This paper presents a new simulation workflow for jitter separation analysis.

Application Note 2014-08-03

Advanced Design System - Brochure
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

Brochure 2014-08-03

PDF PDF 2.61 MB
Simulating Envelope Tracking with Advanced Design System Software - Application Note
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

Application Note 2014-08-02

PDF PDF 2.38 MB
Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2014-08-02

IC-CAP Platform Support Roadmap - Selection Guide
Integrated Circuit Characterization and Analysis Program (IC-CAP) platform support roadmap.

Selection Guide 2014-08-02

IC-CAP Device Modeling Software - Technical Overview
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

Technical Overview 2014-08-02

W2349EP/ET ADS Electro-Thermal Simulator - Data Sheet
The ADS Electro-Thermal Simulator provides accurate, "temperature aware" IC simulation results by using device temperatures that take into account thermal coupling, and thermal characteristics.

Data Sheet 2014-08-02

Simulation and Verification of Pulse Doppler Radar Systems - Application Note
Keysight SystemVue illustrates key algorithms in modern Pulsed Doppler radar system design, and also connects to Keysight sources and signal analyzers to verify hardware performance.

Application Note 2014-08-02

PDF PDF 10.44 MB
W1717 SystemVue Hardware Design Kit - Data Sheet
The SystemVue W1717EP/ET generates fully synthesizable, hierarchical RTL-level Verilog and VHDL that is bit-true, and cycle accurate.

Data Sheet 2014-08-01

WaferPro Express Product Documentation
WaferPro Express Product Documentation

User Manual 2014-08-01

Flexible RF Stimulus Response Validation of Emerging Communications Standards
IMS 2014 - Commercially available flexible simulation tools and flexible instruments can be readily used to create appropriate waveforms by specifying the top level parameters in the time or frequency domains. These can be used to test the emerging and existing RF/MW components and infrastructure and derive the required enhancements to the standards and infrastructure performance.

Demo 2014-08-01

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