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Electronic Measurement

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Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

Matching Network Yin-Yang - Part 1
This Article by Randy Rhea covers basic matching concepts and matching network topologies, emphasizing methods for obtaining the desired performance with networks that are realizable in practice.

Article 2014-07-31

Designing RFID Tags Using Direct Antenna Matching
This Article by Cory Edelman and Murthy Upmaka describes the design challenges involved in RFID design and also focuses on the use of integrated EDA tools to optimally address the challenges.

Article 2014-07-31

Design and Characterization of Discontinuous RF/Microwave Passive Components
This Article by Dean Nicholson presents a design methodology proposed for designing and building RF circuits likely to contain discontinuous regions.

Article 2014-07-31

Overview on Noise in Ring Topology Mixers
This Paper explores the formal definition of noise figure and shows the ADS noise figure definition, and also shows that the noise figure for a mixer does not have to exceed its conversion loss.

Technical Overview 2014-07-31

Overview on Phase Noise and Jitter
This Paper by Rick Poore (Keysight Technologies) focuses on the relationship between phase noise and jitter in free-running oscillators.

Technical Overview 2014-07-31

No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Press Materials 2014-07-28

Genesys Product Structure & Options Summary
A summary of the Genesys product structure, bundles, and key building blocks.

Selection Guide 2014-07-15

Genesys 2014.03 Release Notes
Genesys 2014.03 Product Release Notes.

Release Notes 2014-07-08

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

MQA 2014.04 Documentation
Model Quality Assurance (MQA) 2014.04 Product Documentation.

Reference Guide 2014-06-30

MQA 2014.04 Release Notes
Model Quality Assurance (MQA) 2014.04 product release notes.

Release Notes 2014-06-30

MBP 2014.04 Documentation
Model Builder Program (MBP) 2014.04 Product Documentation

Reference Guide 2014-06-26

IC-CAP 2014.04 Release Notes
IC-CAP 2014.04 Product Release Notes.

Release Notes 2014-06-26

MBP 2014.04 Release Notes
Model Builder Program (MBP) 2014.04 product release notes.

Release Notes 2014-06-26

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

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