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Electronic Measurement

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New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

MQA 2014.04 Documentation
Model Quality Assurance (MQA) 2014.04 Product Documentation.

Reference Guide 2014-06-30

MQA 2014.04 Release Notes
Model Quality Assurance (MQA) 2014.04 product release notes.

Release Notes 2014-06-30

IC-CAP 2014.04 Release Notes
IC-CAP 2014.04 Product Release Notes.

Release Notes 2014-06-26

MBP 2014.04 Release Notes
Model Builder Program (MBP) 2014.04 product release notes.

Release Notes 2014-06-26

MBP 2014.04 Documentation
Model Builder Program (MBP) 2014.04 Product Documentation

Reference Guide 2014-06-26

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

PDF PDF 1.08 MB
Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

PDF PDF 1.47 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

Software Versions, Computer Platforms, and Operating Systems
Keysight EEsof EDA software versions, computer platforms, and operating systems support.

Selection Guide 2014-05-20

Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

ADS Product Structure and Options
A summary of Keysight EEsof EDA's ADS product structure, bundles, and modules.

Selection Guide 2014-05-09

Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Press Materials 2014-04-30

X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Keysight.

Solution Brief 2014-04-30

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

ADS 2014.01 Release Notes
Information about the ADS 2014.01 Release

Release Notes 2014-03-20

ADS 2014 Help
Product-specific release information for Advanced Design System 20114

Help File 2014-03-20

Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Press Materials 2014-03-13

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