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Keysight Technologies to Showcase Products, Present Technical Papers at EMC 2014
Keysight announces that it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5-7.

Dossier de presse 2014-08-01

Wideband Digital Pre-Distortion with Keysight SystemVue and PXI Modular Instrument
Digital Pre-Distortion (DPD) is essential for wideband communications systems based on LTE-Advanced and 802.11ac. Overcome DPD challenges with trusted commercial measurement and modeling tools.

Notes d’application 2014-08-01

Keysight Technologies Begins Operations
Keysight Technologies, Inc. announces the electronic measurement business of Agilent Technologies has begun operating under the Keysight name.

Dossier de presse 2014-08-01

WaferPro Express Product Documentation
WaferPro Express Product Documentation

Manuel de l'utilisateur 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Notes d’application 2014-08-01

Controlled Impedance Line Designer in ADS
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

Démonstration de base 2014-08-01

High Speed Digital Design with Advanced Design System - Brochure
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

Brochure 2014-07-31

PDF PDF 1.33 MB
State of the Art in EM Software for Microwave Engineers - White Paper
This article discusses the three most established EM simulation technologies: MoM, FEM, and FDTD, linking the simulation technology to solving specific applications.

Notes d’application 2014-07-31

No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Dossier de presse 2014-07-28

Genesys Product Structure & Options Summary
A summary of the Genesys product structure, bundles, and key building blocks.

Guide de sélection 2014-07-15

Genesys 2014.03 Release Notes
Genesys 2014.03 Product Release Notes.

Notice de mise à jour 2014-07-08

MQA 2014.04 Documentation
Model Quality Assurance (MQA) 2014.04 Product Documentation.

Guide de références 2014-06-30

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Dossier de presse 2014-06-30

MQA 2014.04 Release Notes
Model Quality Assurance (MQA) 2014.04 product release notes.

Notice de mise à jour 2014-06-30

IC-CAP 2014.04 Release Notes
IC-CAP 2014.04 Product Release Notes.

Notice de mise à jour 2014-06-26

MBP 2014.04 Documentation
Model Builder Program (MBP) 2014.04 Product Documentation

Guide de références 2014-06-26

MBP 2014.04 Release Notes
Model Builder Program (MBP) 2014.04 product release notes.

Notice de mise à jour 2014-06-26

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Notes d’application 2014-06-24

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

PDF PDF 1.47 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Dossier de presse 2014-06-18

Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

PDF PDF 1.08 MB
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Dossier de presse 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Dossier de presse 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Dossier de presse 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Dossier de presse 2014-06-02

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