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Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

Heidi Barnes: DesignCon 2017 Engineer of the Year
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2017-02-22

PDF PDF 2.75 MB
Signal and Power Integrity Products & Options Summary
Signal and Power Integrity Products & Options Summary

Guide de sélection 2017-02-22

City, University of London's Electrical Engineers powered up by Keysight Technologies
Thanks to Keysight, City students now enjoy newly refurbished Electrical and Electronic Engineering facilities.

Dossier de presse 2017-02-21

RF Design Software Learning Kit
Advanced Design System (ADS) RF Design Software Learning Kit from Keysight EEsof EDA.

Matériel de promotion 2017-02-17

New Modelithics COMPLETE Library Release v17.0 for ADS Represents over 15,000 Components
Modelithics announces the latest release of the Modelithics COMPLETE Library version 17.0 for use with Advanced Design System (ADS) simulation software.

Dossier de presse 2017-02-15

Advanced Design System - Brochure
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

Brochure 2017-02-10

PDF PDF 2.45 MB
Signal Integrity & Power Integrity Resources from Keysight EEsof EDA
Signal Integrity & Power Integrity resources for high-speed digital design from Keysight EEsof EDA.

Matériel de promotion 2017-02-03

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

Dossier de presse 2017-02-02

E4727A Advanced Low-Frequency Noise Analyzer
The E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise.

Fiche signalétique 2017-02-01

Keysight to Address IoT, Digital, RF Test Challenges at embedded world 2017
Keysight Technologies announces it will exhibit a number of new products at the embedded world 2017 (www.embedded-world.de/en), Stand 4-208, ECN, Nuremberg, Germany, March 14–16

Dossier de presse 2017-01-30

EMPro 3D EM Simulation Platform Support Roadmap
Keysight EEsof EDA EMPro 3D EM Simulation platform support roadmap

Guide de sélection 2017-01-25

PDF PDF 70 KB
Keysight EEsof EDA Premier Communications Design Software
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2017-01-24

PDF PDF 2.54 MB
RF-Microwave Circuit-System Synthesis & Design Resources
Genesys RF-Microwave Circuit-System Synthesis & Design Resourcesfrom Keysight EEsof EDA.

Matériel de promotion 2017-01-20

Transconductance Modeling for Low-Power Design
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

Keysight Technologies Addresses 400G/PAM-4 Test Challenges at DesignCon 2017
See the latest design and test solutions solve today’s toughest measurement challenges and accelerate new product development.

Dossier de presse 2017-01-17

[Power Device] Switching circuit design techniques using power devices such as GaN and SiC
Are you missing out on a better design technique, thinking in the following way?

Brochure 2016-12-28

PDF PDF 518 KB
Keysight 5G Trial System Design and Validation Solution Demo
This video demonstrates Verizon’s early 5G trial system modeling connected to the latest 3GPP TR 38.900 mmWave channel model. These specifications facilitate early 5G trial system deployments and provide the wireless industry with the ability to test and validate key 5G technical components.

Démonstration de base 2016-12-19

Device Modeling 101 - What are Ft and Fmax?
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

Synthesis Made Easy With Keysight Genesys
Learn how to quickly design many different RF circuits with various topologies in these short tutorial videos. These step-by-step tutorials walk you through the steps to accelerate your routine design tasks from hours to minutes with automatic RF circuit and system synthesis tools.

Démonstration de base 2016-12-01

Keysight to Demonstrate Latest 5G, 802.11ad Design and Test Solutions at IEEE Globecom 2016
Keysight announces it will demonstrate a wide range of first-to-market design, test and characterization solutions at IEEE Globecom 2016, Washington D.C., Dec. 4 – 7.

Dossier de presse 2016-11-29

Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Article 2016-11-29

PDF PDF 3.90 MB
Direct-Synthesis Software Approach Facilitates Filter Design
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

Article 2016-11-28

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