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Recherche par numéro de modèle du produit: Exemples : 34401A, E4440A

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Model Quality Assurance (MQA)
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2014-06-18

PDF PDF 1.08 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Dossier de presse 2014-06-18

Model Builder Program (MBP)
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2014-06-18

PDF PDF 1.47 MB
Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Dossier de presse 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Dossier de presse 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Dossier de presse 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Dossier de presse 2014-06-02

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Dossier de presse 2014-05-27

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Dossier de presse 2014-05-21

Software Versions, Computer Platforms, and Operating Systems
Keysight EEsof EDA software versions, computer platforms, and operating systems support.

Guide de sélection 2014-05-20

WaferPro Express
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2014-05-20

PDF PDF 2.44 MB
Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Dossier de presse 2014-05-19

ADS Product Structure and Options
A summary of Keysight EEsof EDA's ADS product structure, bundles, and modules.

Guide de sélection 2014-05-09

Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Dossier de presse 2014-05-08

Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Dossier de presse 2014-04-30

X-Parameter Design Simulation Models - Modelithics
X-Parameter Design Simulation Models from Modelithics and Keysight.

Brefs de solution 2014-04-30

High Speed Digital Products: Comparison Chart
High Speed Digital Products: Comparison Chart

Guide de sélection 2014-04-10

System-Level Modelers Race The Design Cycle
Microwaves & RF article by Jean-Jacques DeLisle describes how effective system-level modeling and analysis is becoming more critical in virtually every RF system.

Article 2014-04-02

Advanced Design System Brochure
This Brochure highlights the features of Keysight EEsof EDA's Advanced Design System (ADS); the industry's premier RF, Microwave and High-Speed Design platform.

Brochure 2014-04-01

PDF PDF 3.02 MB
ADS 2014.01 Release Notes
Information about the ADS 2014.01 Release

Notice de mise à jour 2014-03-20

ADS 2014 Help
Product-specific release information for Advanced Design System 20114

Fichier d'aide 2014-03-20

Discovering ADS
A collection of Keysight EEsof EDA ADS video demonstrations and tutorials

Démonstration de base 2014-03-20

Using ADS to Investigate Optimal Performance of a Cree FET
This application note documents a workspace that shows how to apply ADS load pull simulations to attain optimal performance of a Cree FET.

Notes d’application 2014-03-17

Agilent Technologies Announces Next-Generation System for Measuring Flicker Noise
Agilent introduces the Agilent EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer—a next-generation hardware and software system for measurement and analysis of flicker noise and random telegraph noise (RTN).

Dossier de presse 2014-03-13

ADS 30-Second Demos
Watch these videos to learn about popular usability improvements we’ve made in Advanced Design System (ADS) to increase your productivity.

Démonstration de base 2014-03-06

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