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IHP supports Silicon RFIC Interoperability with Keysight Technologies’ ADS 2015 Release
IHP announces support for ADS-Virtuoso Interoperable process design kits (PDKs). The PDKs are designed for use with Keysight’s Advanced Design System (ADS) EDA software and provide users access to a new Silicon RFIC interoperability feature available in ADS 2015.01.

Dossier de presse 2015-05-19

Intercept Technology Announces Integration of Advanced Design System Macros in Pantheon
Intercept Technology Inc., a leading EDA software developer for PCB, RF and hybrid design solutions, today announced an agreement to integrate Keysight ADS Board Link macros within the Pantheon design application environment.

Dossier de presse 2015-05-18

Keysight Technologies to Demonstrate Electro-Thermal Solver at IMS 2015
Keysight announces it will demonstrate the ADS Electro-Thermal Simulator at the IEEE MTT-S IMS 2015, Booth 739, Phoenix, May 17-22. The solution provides accurate, temperature aware IC simulation results by using device temperatures that take into account thermal coupling and thermal characteristics of the RFIC/MMIC component packaging.

Dossier de presse 2015-05-13

Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

Dossier de presse 2015-05-11

How to Design an RF Power Amplifier: Class J
This short video will provide an introduction to Class J Power Amplifiers and demonstrate a superior, time saving methodology to design and practically realize a Class J RF power amplifier. First,a theoretical approach will be used to design an ideal circuit from first principles and then circuit design tools will be utilized to synthesize a more realistic circuit topology from the ideal case. The design process will be illustrated using a commercially available GaN MMIC device from Qorvo.

Vidéos pratiques 2015-05-07

Keysight Technologies to Demonstrate RF, Microwave, mmWave Design, Measurement Solutions at IMS 2015
Keysight announces it will demonstrate the latest RF, microwave and mmWave design and measurement solutions for R&D, manufacturing and service at the IEEE MTT-S International Microwave Symposium, Booth 739, Phoenix, May 17-22.

Dossier de presse 2015-05-04

How to Understand 5G: Waveforms
This video will provide you with good guidance for understanding what kinds of new waveforms are being researched for the next generation standard. The example with end-to-end link level simulation will demonstrate waveform quality issues of a multi-carrier system and the nonlinearity from the RF chain.

Vidéos pratiques 2015-05-01

SystemVue Videos on YouTube
SystemVue Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Démonstration de base 2015-04-30

Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Dossier de presse 2015-04-28

W1902 Digital Modem Library
The W1902EP/ET is a simulation reference library supporting 40 types of modulation for Satellite and Military Communications architects, baseband algorithm researchers, and component verifiers in R&D.

Fiche signalétique 2015-04-23

Keysight EEsof EDA "How To Design Power Amplifier" Videos
A collection of "How to Design Power Amplifier" Videos from Keysight EEsof EDA.

Vidéos pratiques 2015-04-22

Advanced Low-Frequency Noise Analyzer Overview
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

Visite de produits 2015-04-21

Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

Dossier de presse 2015-04-16

Discovering SystemVue - MATLAB Script Modeling
Keysight SystemVue now includes MATLAB Script, an equation and modeling engine from MathWorks. This product tutorial shows communications system designers how to create and debug MATLAB models from inside the SystemVue user interface.

Démonstration de base 2015-04-15

Radar Development Using Model-Based Engineering
This application note describes how SystemVue is well suited for use in model-based engineering. It is for system engineers, directors of engineering and people involved in the development of Radar.

Notes d’application 2015-04-14

Keysight Technologies to Showcase Software, Handheld RF/Microwave Products at WAMICON
Keysight announces it will demonstrate new software and handheld RF/microwave capabilities at WAMICON 2015.

Dossier de presse 2015-04-09

Keysight's ADS PCIe, USB Compliance Test Benches Solve Simulation-Measurement Correlation Challenge
Keysight introduces the ADS PCIe and USB Compliance Test Benches, which enable a complete workflow for SerDes engineers, from simulation of a candidate design, through measurement of the finished prototype.

Dossier de presse 2015-04-06

IBM PDKs support RFIC interoperability with latest Keysight Technologies’ ADS software release
IBM now offers specialty foundry clients a new set of interoperable process design kits (PDKs). The PDKs are designed for use with Keysight Technologies’ Advanced Design System (ADS) EDA software and Cadence Design System’s Virtuoso® custom design platform, providing users access to a new silicon RFIC interoperability feature available in ADS 2015.01.

Dossier de presse 2015-04-06

Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2015-04-02

Testing New-Generation WLAN 802.11ac - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

Notes d’application 2015-04-01

Keysight WaferPro Express
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

Visite de produits 2015-03-24

Technical Support Documents & Examples
A database of technical support documents, solutions, and examples written by support engineers.

Guide de références 2015-03-20

5G Channel Sounding
This video discusses Keysight's This video discusses Keysight's mmWave MIMO channel sounding solution for 5G. 5G is aiming to achieve gigabytes per second data rate anywhere, anytime, and to get there, we need to use new technologies such as massive MIMO and millimeter wave broadband. solution for 5G. 5G is aiming to achieve gigabytes per second data rate anywhere, anytime, and to get there, we need to use new technologies such as massive MIMO and millimeter wave broadband.

Démonstration de base 2015-03-19

A Nonlinear Model Complier for RF/MICROWAVE Engineers
This Article presents Genesys latest release which includes a powerful Verilog-A compiler technology and hence enhancing the accuracy of simulation.

Article 2015-03-18

WaferPro Express Software
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2015-03-15


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