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Electronic Measurement

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HeatWave Technical Papers
Links to various technical papers related to HeatWave Electro-Thermal analysis software.

Article 2014-08-27

Temperature Effects in Integrated Circuits
Thermal effects have a significant impact on IC performance and reliability. This video shows how these effects can be analyzed with electrothermal simulation, allowing IC designers to address thermal problems before it’s too late.

Demo 2014-08-27

HeatWave Videos on YouTube
HeatWave Electro-Thermal Simulator Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2014-08-27

WaferPro Express Support Home
WaferPro Express support home page in Keysight EEsof EDA Knowledge Center.

User Manual 2014-08-22

Genesys Platform Operating System Roadmap
Keysight EEsof EDA Genesys RF and Microwave Design Software platform support roadmap.

Selection Guide 2014-08-20

PDF PDF 69 KB
HeatWave Electro-Thermal Simulator
HeatWave Electro-Thermal Simulator data sheet.

Data Sheet 2014-08-19

PDF PDF 571 KB
Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2014-08-11

DDR4 Compliance Test Bench
W2351EP DDR4 Compliance Test Bench data sheet. The W2351EP/ET DDR4 Compliance Test Bench helps solve the problem of simulation-measurement correlation.

Data Sheet 2014-08-07

PDF PDF 1.58 MB
X-parameter Videos on YouTube
X-parameter Video Library playlist in Keysight EEsof EDA's Channel on YouTube.

Demo 2014-08-06

ADS Videos on YouTube
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2014-08-06

IC-CAP Videos on YouTube
Integrated Circuit Characterization and Analysis Program (IC-CAP) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

Demo 2014-08-06

High Speed Digital Design and Simulation Videos on YouTube
Keysight EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.

Demo 2014-08-06

Wafer-level Measurement Solutions – Cascade Microtech
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

Solution Brief 2014-08-04

RF and Microwave Industry-Ready Student Certification Program
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

Brochure 2014-08-03

PDF PDF 576 KB
WaferPro Express Product Documentation
WaferPro Express Product Documentation

User Manual 2014-08-01

Keysight Technologies Begins Operations
Keysight Technologies, Inc. announces the electronic measurement business of Agilent Technologies has begun operating under the Keysight name.

Press Materials 2014-08-01

Keysight Technologies to Showcase Products, Present Technical Papers at EMC 2014
Keysight announces that it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5-7.

Press Materials 2014-08-01

Controlled Impedance Line Designer in ADS
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

Demo 2014-08-01

No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Press Materials 2014-07-28

Genesys Product Structure & Options Summary
A summary of the Genesys product structure, bundles, and key building blocks.

Selection Guide 2014-07-15

Genesys 2014.03 Release Notes
Genesys 2014.03 Product Release Notes.

Release Notes 2014-07-08

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

MQA 2014.04 Release Notes
Model Quality Assurance (MQA) 2014.04 product release notes.

Release Notes 2014-06-30

MQA 2014.04 Documentation
Model Quality Assurance (MQA) 2014.04 Product Documentation.

Reference Guide 2014-06-30

MBP 2014.04 Documentation
Model Builder Program (MBP) 2014.04 Product Documentation

Reference Guide 2014-06-26

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