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Electronic Measurement

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Keysight to Demonstrate Hardware and Electronic Design Automation Software Solutions at EPEPS 2014
Keysight Technologies announces it will demonstrate its latest hardware and electronic design automation software solution releases at EPEPS 2014, Embassy Suites Portland, Portland, Oregon, Oct. 26-29. Keysight is a silver-level sponsor of the event.

Press Materials 2014-10-23

Keysight Technologies Introduces Industry's First 5G Exploration Library
Keysight introduces the Keysight EEsof EDA W1903BEL 5G Baseband Exploration Library.

Press Materials 2014-10-21

E6650A EXF One-Box Tester Scales with Volume Growth, Lowers Cost of Test in Femtocell Mfg
Keysight announces the E6650A EXF wireless test set, the industry's first one-box tester dedicated to femtocell manufacturing. Delivering speed, performance and scalability needed to ramp up production and lower the cost of test. Validation with the latest cellular and WLAN chipsets reduces start-up time.

Press Materials 2014-10-21

Keysight to Demonstrate Latest RF Circuit, System and 3D EM Design and Simulation Solutions at CSICS
Keysight announces it will demonstrate its latest RF circuit, system and 3D electromagnetic design and simulation solutions at the Compound Semiconductor IC Symposium (CSICS 2014), Hyatt Regency La Jolla at Aventine, San Diego, California, Oct. 19-22. Keysight EEsof EDA is a silver-level sponsor of the event.

Press Materials 2014-10-14

Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

Press Materials 2014-10-13

Keysight Technologies announces expanded TRX module and EXM wireless test set enhancements
Keysight Technologies Announces Expanded TRX Module and EXM Wireless Test Set Enhancements

Press Materials 2014-10-01

Keysight Introduces DDR Bus Simulator to Solve the Bit-Error-Rate Contour Simulation Challenge
Keysight Technologies introduces the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification.

Press Materials 2014-09-30

Keysight Technologies Introduces Design and Test Solutions at European Microwave Week
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

Press Materials 2014-09-03

Keysight Introduces Cost-Effective Software Test Suite for Improving Power Amplifier Efficiency
Press release highlighting the N7614B Signal Studio for Power Amplifier Test

Press Materials 2014-08-11

Keysight Technologies Introduces Signal Generation Support for LTE/LTE-Advanced Uplink 2x2 MIMO
Press releases highlighting the N7624B and N7625B Signal Studio

Press Materials 2014-08-08

Keysight Technologies Introduces Signal Generation Solution for IEEE 802.15.4g-Based Wi-SUN
Press releases highlighting the N7610B Signal Studio for IEEE 802.15.4g

Press Materials 2014-08-08

Keysight Technologies to Showcase Products, Present Technical Papers at EMC 2014
Keysight announces that it will demonstrate some of its focused products at EMC 2014, the IEEE International Symposium on Electromagnetic Compatibility, Raleigh Convention Center, Booth 323, Raleigh, North Carolina, Aug. 5-7.

Press Materials 2014-08-01

Keysight Technologies Begins Operations
Keysight Technologies, Inc. announces the electronic measurement business of Agilent Technologies has begun operating under the Keysight name.

Press Materials 2014-08-01

No-Cost, Six-Month Availability of Modelithics COMPLETE Library for Genesys 2014
Extensive Model Library Enables Exceptional Accuracy with Genesys RF Simulation Software.

Press Materials 2014-07-28

New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

Press Materials 2014-06-18

Agilent Technologies Introduces Advanced Open FPGA Design Flow and Real-Time Measurement Solution
Agilent announces that the Agilent EEsof EDA W1462 SystemVue FPGA Architect now supports on-board FPGA design and simulation with the Agilent M9703A AXIe wideband digital receiver/digitizer.

Press Materials 2014-06-17

Agilent Technologies Announces Portfolio of DOCSIS 3.1 Test Solutions
Agilent announces a portfolio of Data Over Cable Service Interface Specification (DOCSIS) hardware and software test solutions for generating and analyzing signals up to a bandwidth of 192 MHz. The test solutions are used by R&D engineers to test transmitters, receivers and components against the requirements set forth in the DOCSIS 3.1 specification.

Press Materials 2014-06-12

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Agilent Technologies Introduces Advanced 4G Design and Validation Support
Agilent announces that the Agilent EEsof EDA W1918 LTE-Advanced baseband verification library has added support for key 4G technologies, such as Adaptive Modulation and Coding (AMC) and Coordinated Multi-Point (CoMP).

Press Materials 2014-06-02

Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design
Keysight announces the latest release of Genesys 2014.

Press Materials 2014-05-27

Agilent Technologies to Attend IMS with Leading-Edge RF/Microwave Design and Measurement Solutions
Agilent announces it will attend the IEEE MTT-S International Microwave Symposium 2014 (Booth 1133), June 1-6, in Tampa, Fla. The company will demonstrate over 20 of its newest design and measurement solutions.

Press Materials 2014-05-21

Agilent Technologies Introduces Modeling, Verification Platform for Radar, Electronic Warfare
Agilent announces that the W1905 radar model library has been enhanced to simulate moving 3-D radar scenarios as well as phased-array adaptive beamforming.

Press Materials 2014-05-19

Advanced Design System Selected by GIT Japan for Front-to-Back MMIC and Silicon RFIC Implementation
GIT Japan Inc., a provider of advanced interface technologies between people and information, and a competence center for ultrawideband (UWB) chipset and module development, has selected the ADS platform for complete GaAs/GaN- and silicon-based RFIC/MMIC implementations.

Press Materials 2014-05-08

Agilent Technologies Acquires Electrothermal Analysis Technology from Gradient Design Automation
Agilent announces its acquisition of electrothermal analysis technology from Gradient Design Automation, the maker of HeatWave electrothermal analysis software.

Press Materials 2014-04-30

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