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Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-04-04

STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

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Python Programming integration with IC-CAP
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

Ensuring High Signal Quality in PCIe Gen3 Channels
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

Heidi Barnes: DesignCon 2017 Engineer of the Year
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

Why Device Modeling Services?
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

Transconductance Modeling for Low-Power Design
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

Device Modeling 101 - What are Ft and Fmax?
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules
Microwave Product Digest (MPD) featured article on "Integrating Multiple Technology Devices onto Laminate-Based Multi-Chip-Modules Using an Integrated Design Flow", written by Keefe Bohanan, Applications Engineer District Manager for Keysight EEsof EDA.

Article 2016-11-29

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Direct-Synthesis Software Approach Facilitates Filter Design
This Microwaves & RF article discusses how Genesys software can be used to design filters with the direct-synthesis technique. A lowpass filter example is presented to illustrate the software’s capabilities.

Article 2016-11-28

Device Modeling 101 - How to Extract Threshold Voltage of MOSFETs
Threshold voltage (Vth) is one of the most important electrical parameters in MOSFET modeling. Learn how to extract Vth using MBP.

Journal 2016-11-17

8 Steps to a Successful DDR4 Design
Learn how Keysight's design flow example for DDR4 can help you achive confidence in your design and help you ensure success.

Journal 2016-10-20

Ericsson and Freiburg U. Design High-Q Power Harvesting Circuit Using ADS
Keysight’s ADS harmonic balance was used to explore the design space around the innovative impedance transformation using a high Q quartz crystal resonator to transform the low voltage from the low impedance antenna to a voltage high enough to overcome the Schottky diode junction voltage.

Case Study 2016-10-19

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Using DSP and RF circuit co-design to reduce risk and cost
For modern design organizations, it’s now more imperative than ever that they simulate both Digital Signal Processor (DSP) and RF circuits together at the system level using mixed signals.

Article 2016-10-11

Software plus signal generators and analyzers support IEEE 802.11p design and test
Jungik Suh, marketing program manager, Automotive & Energy Solutions, Keysight Technologies, provides input on several Keysight solutions for the connected-car arena for Evaluation Engineering's October print special report on automotive test.

Article 2016-10-05

A Quick Fix for Poor Capacitor, Inductor and DC/DC Impedance Measurements
Modern Test & Measure article by Steve Sandler (Picotest) explains why you need an extended range, partial S2p measurement and how to make this improved measurement.

Article 2016-10-03

Best Practices for Connector Models
Eric Bogatin, Signal Integrity Journal Editor, discusses best practices for connector modeling and measuring with Heidi Barnes, Keysight ADS application engineering specialist, and Jim Nadolny, Principle SI Engineer for Samtec.

Article 2016-09-30

Correlating simulation and measurement for a USB Type-C reference channel (Part 1)
This article from Electronic Products discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Article 2016-09-21

E Pluribus Unum: An Integrated Design Flow for Phased Arrays
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

Feature Story 2016-07-20

Follow Keysight EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

ESL Design Notebook Blog
The blog home of Electronic System-Level Design at Keysight Technologies highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2016-07-14

Phased array beamforming software design, test, and measurement kit introduced by Keysight
Military & Aerospace Electronics article introduces the W1720EP phased array radar beamforming kit add-on software simulation personality for the SystemVue 2016.08 design and test and measurement environment.

Article 2016-06-13

Solving Mobile Radar Measurement Challenges
This Microwave Journal article examines an alternative simulation method that allows for better cross-domain modeling in a single framework, to capture the complete effects of modern radar system performance.

Article 2016-06-13

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

Article 2016-03-31

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