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1-25 of 474

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

Virtual Flight Testing of Radar System Performance Using SystemVue and STK - White Paper
Keysight SystemVue and AGI STK can be integrated to provide virtual flight testing of radar and electronic warfare algorithms, saving both time and money.

Application Note 2015-11-13

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Application Note 2015-10-15

Switch Mode Power Supply Measurements - Application Note
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2015-10-14

Oscilloscope Waveform Update Rate Determines Ability to Capture Elusive Events - Application Note
See how you can increase your odds of finding infrequent glitches with a high oscilloscope update rate.

Application Note 2015-10-13

Evaluating Oscilloscope Vertical Noise Characteristics - Application Note
Measurement system noise will degrade your actual signal measurement accuracy, especially when you are measuring low-level signals and noise. Since oscilloscopes are broadband measurement instruments, the higher the bandwidth of the scope, the higher the vertical noise will be – in most situations.

Application Note 2015-10-05

A Cost-effective Way to Test Bluetooth® Modules on Smart Devices
This application note introduces the cost-effective Bluetooth test solution based on N9320B/N9322C BSA which offers an alternative solution for small to device manufacturers

Application Note 2015-09-28

Testing Voice Over LTE (VoLTE) Phones - Application Note
This application note explains a solution for testing voice over LTE (VoLTE) phones that is well-suited for LTE mobile phone developers, test engineers, and test lab personnel.

Application Note 2015-09-14

Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

Application Note 2015-08-31

Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2015-08-13

Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

W-CDMA Dynamic Power Analysis Using the 8960 - Application Note
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

Application Note 2015-07-31

How to Take Fast, Simultaneous Measurements of Two or More Signals using BenchVue Software
Keysight BenchVue software for the PC accelerates your testing by providing multiple instrument measurement visibility and data capture with no programming necessary.

Application Note 2015-07-30

Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

Application Note 2015-07-25

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

Application Note 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

Application Note 2015-07-22

Characterizing Passive Components in Wireless Power Transfer (WPT) Systems - Application Note
This app note describes passive components used in wireless power transfer systems and their requirements as well as measurement solutions using Keysight network analyzers and impedance analyzers.

Application Note 2015-07-16

Dynamic Power Measurements for cdma2000 on the Keysight 8960 Wireless Test Set - Application Note
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.

Application Note 2015-07-15

New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2015-07-12

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-06-05

Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

Analysis Tool 2015-05-29

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2015-05-15

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01


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