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International Microwave Symposium (IMS) 2017
June 4 - 9, 2017; Honolulu, Hawaii

Tradeshow

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2017-08-08

Test at Breakneck Speeds with System Power Supplies Webcast
Original broadcast March 30, 2017

Webcast - recorded

Fundamentals of IV Measurements Webcast
Original broadcast February 8, 2017

Webcast - recorded

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
Fundamentals of Transient Low-Current Measurement Webcast
Original broadcast October 25, 2016

Webcast - recorded

Improve Your Data Acquisition IQ!
Original broadcast October 19, 2016

Webcast - recorded

Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

Webcast

Multiport and Multi-site Test Optimization Techniques Webcast
Original broadcast June 3, 2015

Webcast - recorded

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Hybrid-Active Load Pull with PNA-X and Maury Microwave
Original broadcast Jun 12, 2012

Webcast - recorded

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

PDF PDF 1.48 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training