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Fundamentals of IV Measurements Webcast
Live broadcast February 8, 2017; 10am PT / 1pm ET

Webcast - recorded

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
Fundamentals of Transient Low-Current Measurement Webcast
Original broadcast October 25, 2016

Webcast - recorded

Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

Webcast

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded