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모델번호로 검색: 예제: 34401A, E4440A

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정렬방식:
Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

웹캐스트 - recorded

Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

세미나 프리젠테이션 2013-10-22

DesignCon 2014
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

트래이드쇼

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Live broadcast September 4, 2014; 7am PT/10am ET/16:00 CET

웹캐스트

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

웹캐스트 - recorded

IC-CAP User Training
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

교육

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

웹캐스트 - recorded

Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EEsof EDA Customer Education and Services.

교육 자료 2010-08-11

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

세미나 프리젠테이션 2012-02-07

PDF PDF 2.51 MB
MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

세미나 프리젠테이션 2013-10-22

PDF PDF 1.48 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

세미나 프리젠테이션 2011-06-22

PDF PDF 3.07 MB
Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

웹캐스트 - recorded