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IC-CAP Device Modeling Software - Technical Overview
This Technical Overview presents Keysight Technologies IC-CAP Device Modeling Software Release 2006. The IC-CAP software automates the process of accurate device characterization for today's RFIC designer.

Technical Overview 2014-08-02

Proposed System Solution for 1/f Noise Parameter Extraction
This paper describes a measurement setup for measuring the 1/f noise of Bipolar and MOS devices.

Technical Overview 2000-12-01

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