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Automating On-Wafer Measurements with the new Agilent IC-CAP WaferPro
Originally broadcast Jan 27, 2011

Webcast - recorded

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Genesys Webcasts - "How-To-Design" series
Originally broadcast in 2009. Access the 6 WebEX recordings

Webcast - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded