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Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2014-09-09

Beyond CMOS Vs. GaAs: Picking The Right Technology
Design software can help evaluate the many different technology options for a high-frequency electronic circuit or system under a wide range of operating conditions.

Article 2013-10-24

Realization and Analysis of Electronically Steerable Phased Array using Scripting & Parameterization
With the advent of multi-core, high speed processors and abundant memory availability, complex designs using 3-D full-wave electromagnetic (EM) tools have become common choice for microwave and antenna engineers.

Article 2013-07-09

Simulation and Measurement-based X-parameter Models for Power Amplifiers with Envelope Tracking
An investigation of envelope tracking power amplifiers using simulation-based and measurement-based frequency domain static XP models.

Article 2013-06-30

PDF PDF 544 KB
Agilent embraces GaN modeling in IC-CAP upgrade
EETimes Design Article highlights new capabilities in IC-CAP 2013.01.

Article 2013-01-09

Future Device Modeling Trends
Modeling the nonlinear device (basic nonlinear component) for circuit and system simulation downstream.

Article 2012-11-28

PDF PDF 6.08 MB
Enabling Fast Characterization of PA Performance with Modulated Signals
Microwave Product Digest (MPD) featured article written by Agilent Technologies' Andy Howard.

Journal 2012-10-15

Comparing In-house and Commercial Load Solutions for Automotive Test

Article 2012-07-17

Boundary-Scan Advanced Diagnostic Methods
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

Article 2012-04-17

PDF PDF 1.20 MB
Testing DDR Memory; How On-Chip DFT Helps
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

Article 2012-04-17

PDF PDF 530 KB
An Innovative and Integrated Approach to III-V Circuit Design
This article explains how to drive III-V circuit design improvement by unified modeling, Design of Experiments (DOE) simulation, and Pareto Analysis

Article 2011-01-10

PDF PDF 360 KB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

Article 2010-12-10

PDF PDF 789 KB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem"
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 402 KB
Principal Component Analysis-Based Compensation for Measurement Errors
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

Article 2010-12-10

PDF PDF 1.10 MB
The Proposed IEEE Test Standards
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 2.83 MB
Limited Access Tools Improve Test Coverage
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

Article 2010-10-20

PDF PDF 275 KB
X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

Journal 2010-07-15

Comparing Boundary Scan Methods White Paper
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

Article 2010-06-09

PDF PDF 2.68 MB
Follow Agilent EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

Accelerating Advanced Node CMOS RFIC Design
Microwave Journal article by David Vye

Journal 2009-12-07

X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

Article 2009-10-09

PDF PDF 1.92 GB
Quick ACPR Analysis Performs Necessary PA Simulations
This article describes a fast method of simulating Adjacent Channel Power Ratio (ACPR) versus input (or output) power level, based on a swept 1-tone harmonic balance simulation.

Journal 2006-07-01

Digital Predistortion Linearizes Wireless Power Amplifiers
This Article by Wan-Jong Kim, Shawn P. Stapleton, Jong Heon Kim, and Cory Edelman focuses on how digital predistortion linearizes wireless power amplifiers.

Article 2005-09-01

PDF PDF 1.75 MB
An Innovative Approach to Faster RFIC Transmitter Design
This Article by Andy Howard presents a number of simulation techniques; including HB, circuit envelope, EM, & wireless test benches applied to the integrated RFIC transceiver for WLANs/ IEEE 802.11b.

Article 2005-04-01

PDF PDF 3.68 MB
Effective IM2 Estimation for Two-Tone and WCDMA Modulated Blockers in Zero-IF
This Article written by Walid Y. Ali-Ahmad explains effective IM2 estimation for two-tone and WCDMA modulated blockers in zero-IF.

Article 2004-04-01

PDF PDF 306 KB

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