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Customizing the Keysight TestExec SL Operator Interface using Visual Basic
This application note describes how users of the Keysight TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.

Application Note 2009-06-25

Testing Mechatronic Power Drivers Using the Keysight L4532A/L4534A Digitizers
This 15-page Application Note discusses mechatronics for modern motion control, measurement challenges, using the LXI as a development tool, determinining correct measurement windows, and capturing multiple channels using the L4534A.

Application Note 2009-06-18

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

Design of a 4.9 to 6.0 GHz Two-stage stage stage Low Noise Amplifier for 802.11a, HiperLAN2 and HiSW
This Application Note examines the design of a compact two-stage, low noise, unconditionally stable, amplifier for 802.11a, HiperLAN2 and HiSWANa receiver applications using ATF-551M4 E-PHEMT.

Application Note 2009-05-07

PDF PDF 493 KB
Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Keysight 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
Linearization of Multi-Carrier Power Amplifier via Digital Predistortion in ADS
This Application Bulletin describes a method for using digital predistortion in Advanced Design System with the Linearization Design Guide to minimize spectral regrowth in wireless systems.

Application Note 2009-03-19

Generating I-V Curves with the Keysight E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Keysight Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB
UWB Antenna Measurements with the 20 GHz E5071C ENA Network Analyzer
This application note describes benefits of measuring UWB antennas with the E5071C 20 GHz option and introduces measurement tips for using the gating feature with the E5071C.

Application Note 2008-11-10

IFT Battery Current Drain Solution - Application Note
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

PDF PDF 492 KB
Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

Small Engine Dynamometer Testing - Application Note
Performing Dynamometer Testing on Combustion Engines

Application Note 2008-06-01

PDF PDF 443 KB
High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
Automotive ECU Transient Testing Using Captured Power System Waveforms

Application Note 2008-01-10

The Benefits of Using LXI in Automotive Functional Test
LXI can help maximize performance, minimize cost and extend capital investments into the future. This whitepaper explores the benefits associated with using LXI in Automotive Functional test.

Application Note 2007-11-29

PDF PDF 471 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Application Note 2007-10-18

X-ray Test Users Utilize BOM Explorer to Change
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Application Note 2007-10-12

Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Application Note 2007-10-12

Accelerate Wireless Mobile Device Design Validation with Automated Test Solution
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

Application Note 2007-10-11

Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Application Note 2007-10-11

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