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Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

Application Note 2012-02-08

How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2011-06-24

PDF PDF 1.09 MB
Genesys S/Filter Software Directly Synthesizes Filters with Arbitrary Transmission Zero Placement
This white paper describes direct filter synthesis capabilities in Keysight Genesys S/Filter design software used to realize custom filter response.

Application Note 2011-01-12

Automated Measurement with IC-CAP
This application note describes a seamless solution for automated measurement and parameter extraction with Keysight IC-CAP

Application Note 2011-01-10

Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Application Note 2010-12-20

PDF PDF 3.15 MB
Making Conducted and Radiated Emissions Measurements - Application Note
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2010-07-13

Dynamic Power Analysis Techniques for Low-power Satellite Design Appilcation Note
Using high-performance DC sources to characterize and optimize dynamic current.

Application Note 2010-04-15

PDF PDF 528 KB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
Creating Hardware Handler in C/C++ for Keysight TestExec SL
A hardware handler enhances the Keysight TestExec SL's ability to control devices by communicating directly with the instrument's driver. This application note describes how to create hardware handlers for the TestExec SL.

Application Note 2009-09-10

PDF PDF 181 KB
Configuring Signal and Load Switching Using Keysight TestExec SL
This application note describes how users of the Keysight TestExec SL software can easily configure and set up switching for the increasing number of channels on units under test with the Switch Manager feature in the software.

Application Note 2009-08-13

PDF PDF 286 KB
AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.

Application Note 2009-08-04

PDF PDF 181 KB
Database Connectivity Guide for TestExec SL
This application note outlines the importance of proper data logging in a database and discusses best practices to import extensible markup language (XML) files from TestExec into a database.

Application Note 2009-07-16

PDF PDF 434 KB
Customizing the Keysight TestExec SL Operator Interface using Visual Basic
This application note describes how users of the Keysight TestExec SL software can customize the operator user interface using Visual Basic.

Application Note 2009-07-07

PDF PDF 312 KB
Practical RF Amp. Design Using the Available Gain Procedure & the ADS EM/Circuit Co-Sim. Capability
This white paper features a method of designing a low noise RF amplifier for an 802.11b receiver application and contains an Avago ATF54143 PHEMT transistor.

Application Note 2009-06-25

Testing Mechatronic Power Drivers Using the Keysight L4532A/L4534A Digitizers
This 15-page Application Note discusses mechatronics for modern motion control, measurement challenges, using the LXI as a development tool, determinining correct measurement windows, and capturing multiple channels using the L4534A.

Application Note 2009-06-18

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

Design of a 4.9 to 6.0 GHz Two-stage stage stage Low Noise Amplifier for 802.11a, HiperLAN2 and HiSW
This Application Note examines the design of a compact two-stage, low noise, unconditionally stable, amplifier for 802.11a, HiperLAN2 and HiSWANa receiver applications using ATF-551M4 E-PHEMT.

Application Note 2009-05-07

PDF PDF 493 KB
Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Keysight 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

PDF PDF 55 KB
Linearization of Multi-Carrier Power Amplifier via Digital Predistortion in ADS
This Application Bulletin describes a method for using digital predistortion in Advanced Design System with the Linearization Design Guide to minimize spectral regrowth in wireless systems.

Application Note 2009-03-19

Generating I-V Curves with the Keysight E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Keysight Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

PDF PDF 342 KB

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