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Electronic Measurement

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Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2014-06-24

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

I-V Curve Characterization in High-Power Solar Cells and Modules
This unique application note discusses capturing the I-V curve of a high power solar cell or module under illuminated conditions and offers the ability to characterize the dark or reverse bias region of the cell or module under test.

Application Note 2009-09-30

PDF PDF 378 KB
AN B1500-14 IV and CV Characterizations of Solar/Photovoltaic Cells Using the B1500A
This application note shows how the B1500A can be used to evaluate a variety of solar cell types.

Application Note 2009-08-07

Managing High-Power DC Requirements for Life and Durability Test Systems
New product life and durability testing (Life testing) is critical in highly competitive markets.

Application Note 2009-08-04

PDF PDF 181 KB
Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications

Application Note 2009-06-05

Testing Terrestrial Solar-Powered Inverters Using Solar Array Simulation Techniques
This application note describes how to test terrestrial solar-powered inverters using solar array simulation techniques.

Application Note 2009-06-01

Using Two Power Supplies for Higher Current Solar Cell Characterizing
This application note describes the Keysight 663XB Power Supplies connected in anti-series to achieve four-quadrant operation for Solar Cell and Module Testing.

Application Note 2009-04-29

Generating I-V Curves with the Keysight E4360A Solar Array Simulator Using the Parameters Voc, Isc, N

Application Note 2009-03-12

IFT Battery Current Drain Solution - Application Note
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

Automotive ECU Transient Testing Using Captured Power System Waveforms

Application Note 2008-01-10

Accelerate Wireless Mobile Device Design Validation with Automated Test Solution
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

Application Note 2007-10-11

Automating Keysight 14565B Software Battery Drain Measurements with LabVIEW
This document describes the process of making battery drain measurements with the Keysight 14565B and National Instruments Labview

Application Note 2007-10-11

PDF PDF 188 KB
Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427)
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2007-01-31

Mobile Communications Device Testing (AN 1310)
Pulsed battery drain currents, regulated charge currents, and remote DUT fixtures, dictate the need for specialized power sourcing, loading, and measurement capabilities for testing mobile communications devices.

Application Note 2007-01-16

PDF PDF 251 KB
Current Drain Analysis Enhances WLAN Network Card Design and Test (AN 1468)
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

Highly Accurate Amplifier ACLR and ACPR Testing with the Keysight N5182A MXG Vector Signal Generator
This note discusses ACLR/ACPR as a key performance characteristic for power amplifiers used to test wireless communications systems and how the Keysight MXG vector signal generator is used to test them.

Application Note 2006-08-30

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

PDF PDF 275 KB
Evaluating Battery Run-down Performance of Mobile Wireless Devices
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2002-11-04

Using Battery Drain Analysis to Improve Mobile-Device Operating Time
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life.

Application Note 2002-09-19

Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396)
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.

Application Note 2002-04-03

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