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Technical Support

Electronic Measurement

Find by Product Model Number: Examples: 34401A, E4440A

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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

Application Note 2015-08-01

Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2014-07-31

CAN Eye-Diagram Mask Testing - Application Note
InfiniiVision X-Series scopes can trigger, decode, and perform eye-diagram mask test measurements on differential CAN bus signals, as well as perform analysis on other serial bus standards.

Application Note 2014-03-03

High Precision Time Domain Reflectometry - Application Note
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Application Note 2013-02-26

IFT Battery Current Drain Solution - Application Note
Provides an overview of the Interactive Functional Test (IFT) battery current drain analysis solution using the 8960 (E5515C) and the 66319/21B or D.

Application Note 2008-09-30

Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

Accelerate Wireless Mobile Device Design Validation with Automated Test Solution
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

Application Note 2007-10-11

Automating Keysight 14565B Software Battery Drain Measurements with LabVIEW
This document describes the process of making battery drain measurements with the Keysight 14565B and National Instruments Labview

Application Note 2007-10-11

Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427)
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2007-01-31

Current Drain Analysis Enhances WLAN Network Card Design and Test - Application Note
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Application Note 2004-07-29

High-Precision TDR with the Keysight 86100 DCA & Picosecond Pulse Labs 4020 Source Enhancement Module
Learn how to build a high-precision time-domain reflectometry/time-domain transmission measurement system.

Application Note 2003-09-12

Evaluating Microstrip with Time Domain Reflectometry (AN 1304-1)
This application note discusses microstrip transmission line techniques that were evaluated using TDR measurements.

Application Note 2000-11-01

Measuring Characteristic Impedance of Short Rambus Motherboard Traces (AN 1304-4)
This application note tells you how to perform characteristic impedance measurements on Rambus motherboards and SO-RIMM's using TDR with normalization and verification.

Application Note 2000-11-01