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Keysight EEsof EDA Newsletter - Product and Application News
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2016-05-03

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

Article 2016-03-31

PDF PDF 644 KB
The PDN Bandini Mountain and Other Things I Didn’t Know I Didn’t Know
"In engineering, it's what you don't know you don't know that can ruin your day and keep you awake at nights." From Bert Simonovich's practical design notes.

Journal 2016-03-30

Solving Electronics Design Challenges of an Aerospace System with EDA Tools
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

Article 2016-03-22

Minimizing Design Risk, Shortening Development Time of a Digital Transmission System
Powerful design and simulation software provides valuable insights to help uncover and solve difficult design challenges at every stage of the design process.

Case Study 2015-12-15

PDF PDF 1.17 MB
Keysight EEsof EDA makes it easy to get back to school—at least virtually
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

Article 2015-09-11

Challenges extend from simulation to compliance
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

Article 2015-07-08

Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

Article 2015-04-02

PDF PDF 3.34 MB
PCI Express Receiver Testing Responds To New Challenges - Article
PCI Express Receiver Testing Responds To New Challenges

Article 2015-03-24

Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

Article 2014-08-04

PDF PDF 1.18 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

Article 2014-08-04

PDF PDF 8.20 MB
Mechanism of Jitter Amplification in Clock Channels
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

Article 2014-08-04

PDF PDF 715 KB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

Article 2014-08-04

PDF PDF 2.84 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

Article 2014-08-04

PDF PDF 1.88 MB
Practical Analysis of Backplane Vias - White Paper
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.

Case Study 2014-07-31

PDF PDF 4.57 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.

Article 2011-01-11

Follow Agilent EEsof EDA on Twitter!
Twitter enables you to keep current on news and updates with Agilent EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2010-03-04

S-parameters Without Tears
This article explains s-parameter theory and shows how to create accurate, delay-causal, and passive time-domain models by combining band-limited s-parameter data with knowledge about the physical characteristics of a component.

Journal 2010-01-25

Signal Integrity Simulation of PCI Express Gen 2 Channel
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.

Article 2009-03-23

PDF PDF 1.81 MB
Inphi Delivers Memory Interface Chip for DDR3-1600 Using Advanced Design System
This Success Story details how Inphi delivered memory interface chip for DDR3-1600 using Keysight’s Advance Design System (ADS).

Case Study 2009-03-12

PDF PDF 196 KB
Exploring The Test Requirements For DisplayPort Receivers
Exploring The Test Requirements For DisplayPort Receivers

Article 2008-01-28

PDF PDF 543 Bytes
Signal Integrity Analysis and Simulation Tools include IBIS Models
This Article describes the types of models that need to be taken together for high-speed signal integrity analysis, and illustrates their use in a simulation of a high-speed memory circuit.

Article 2004-09-01

PDF PDF 411 KB