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Technical Support

Electronic Measurement

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Testing the Internet of Things - Article Reprint
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

Article 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint
A new system performs both ICT and boundary scan in high-volume settings.

Article 2016-02-09

PDF PDF 222 KB
Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

Article 2016-02-09

PDF PDF 381 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

Article 2016-02-09

PDF PDF 318 KB
Finding Fault - Article Reprint
testing mission-critical functions in automotive electronics.

Article 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint
Boundary scan and embedded test will need to make up for ICT gaps.

Article 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint
Testing boundary scan devices no longer need be a laborious task.

Article 2016-02-03

PDF PDF 217 KB
Automating In-Circuit Test - Article Reprint
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

Article 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint
Manufacturers are increasingly designing products for ease of test.

Article 2016-02-02

PDF PDF 279 KB
LXI Instrumentation applied to bioanalytical electrical characterization

Article 2014-04-07

ECN article: Remote Wireless Test With LXI
Article reprinted with approval from ECN magazine.

Article 2014-04-07